A Screening Technique for Establishing the Stability of Metal Film Resistors

A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.

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Published in:Active and passive electronic components 1978-01, Vol.5 (2), p.71-77
Main Authors: Goswami, A. P., Satyanarayana, L., Sivaji, N. V. M.
Format: Article
Language:English
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container_end_page 77
container_issue 2
container_start_page 71
container_title Active and passive electronic components
container_volume 5
creator Goswami, A. P.
Satyanarayana, L.
Sivaji, N. V. M.
description A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.
doi_str_mv 10.1155/APEC.5.71
format article
fullrecord <record><control><sourceid>doaj_cross</sourceid><recordid>TN_cdi_doaj_primary_oai_doaj_org_article_e77a42761e5c4441acbabb21651b1047</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><doaj_id>oai_doaj_org_article_e77a42761e5c4441acbabb21651b1047</doaj_id><sourcerecordid>oai_doaj_org_article_e77a42761e5c4441acbabb21651b1047</sourcerecordid><originalsourceid>FETCH-LOGICAL-c288t-691b8f7d06f34694fc212bea7b827135928431d2de7e08d669c8671b0525af163</originalsourceid><addsrcrecordid>eNo9kE1PAjEYhBujiYge_Ae9eljs2-3XHgkBJcFoBM9N222hZGG1rQf-vSDG02RmkieTQegeyAiA88fx23Qy4iMJF2gAXNQVJzVcogFRilaSg7hGNzlvCSE1Uc0ALcZ46ZL3-7hf45V3m338-vY49AlPczG2i3lzqsrG4-XRxy6WA-4DfvHFdHgWux1-9znm0qd8i66C6bK_-9Mh-phNV5PnavH6NJ-MF5WjSpVKNGBVkC0RoWaiYcFRoNYbaRWVUPOGKlZDS1svPVGtEI1TQoIlnHITQNRDND9z295s9WeKO5MOujdR_wZ9WmuTSnSd115Kw6gU4LljjIFx1lhLQXCwQJg8sh7OLJf6nJMP_zwg-nSpPl2quT4u-wF2WmdJ</addsrcrecordid><sourcetype>Open Website</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A Screening Technique for Establishing the Stability of Metal Film Resistors</title><source>Wiley Online Library Open Access</source><source>IngentaConnect Journals</source><creator>Goswami, A. P. ; Satyanarayana, L. ; Sivaji, N. V. M.</creator><creatorcontrib>Goswami, A. P. ; Satyanarayana, L. ; Sivaji, N. V. M.</creatorcontrib><description>A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.</description><identifier>ISSN: 0882-7516</identifier><identifier>EISSN: 1563-5031</identifier><identifier>DOI: 10.1155/APEC.5.71</identifier><language>eng</language><publisher>Hindawi Limited</publisher><ispartof>Active and passive electronic components, 1978-01, Vol.5 (2), p.71-77</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Goswami, A. P.</creatorcontrib><creatorcontrib>Satyanarayana, L.</creatorcontrib><creatorcontrib>Sivaji, N. V. M.</creatorcontrib><title>A Screening Technique for Establishing the Stability of Metal Film Resistors</title><title>Active and passive electronic components</title><description>A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.</description><issn>0882-7516</issn><issn>1563-5031</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1978</creationdate><recordtype>article</recordtype><sourceid>DOA</sourceid><recordid>eNo9kE1PAjEYhBujiYge_Ae9eljs2-3XHgkBJcFoBM9N222hZGG1rQf-vSDG02RmkieTQegeyAiA88fx23Qy4iMJF2gAXNQVJzVcogFRilaSg7hGNzlvCSE1Uc0ALcZ46ZL3-7hf45V3m338-vY49AlPczG2i3lzqsrG4-XRxy6WA-4DfvHFdHgWux1-9znm0qd8i66C6bK_-9Mh-phNV5PnavH6NJ-MF5WjSpVKNGBVkC0RoWaiYcFRoNYbaRWVUPOGKlZDS1svPVGtEI1TQoIlnHITQNRDND9z295s9WeKO5MOujdR_wZ9WmuTSnSd115Kw6gU4LljjIFx1lhLQXCwQJg8sh7OLJf6nJMP_zwg-nSpPl2quT4u-wF2WmdJ</recordid><startdate>197801</startdate><enddate>197801</enddate><creator>Goswami, A. P.</creator><creator>Satyanarayana, L.</creator><creator>Sivaji, N. V. M.</creator><general>Hindawi Limited</general><scope>AAYXX</scope><scope>CITATION</scope><scope>DOA</scope></search><sort><creationdate>197801</creationdate><title>A Screening Technique for Establishing the Stability of Metal Film Resistors</title><author>Goswami, A. P. ; Satyanarayana, L. ; Sivaji, N. V. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c288t-691b8f7d06f34694fc212bea7b827135928431d2de7e08d669c8671b0525af163</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1978</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Goswami, A. P.</creatorcontrib><creatorcontrib>Satyanarayana, L.</creatorcontrib><creatorcontrib>Sivaji, N. V. M.</creatorcontrib><collection>CrossRef</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>Active and passive electronic components</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Goswami, A. P.</au><au>Satyanarayana, L.</au><au>Sivaji, N. V. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Screening Technique for Establishing the Stability of Metal Film Resistors</atitle><jtitle>Active and passive electronic components</jtitle><date>1978-01</date><risdate>1978</risdate><volume>5</volume><issue>2</issue><spage>71</spage><epage>77</epage><pages>71-77</pages><issn>0882-7516</issn><eissn>1563-5031</eissn><abstract>A technique has been designed whereby stability data for metal film resistors may be predicted within 24 hours. Regressional analysis and statistics are used in the technique.</abstract><pub>Hindawi Limited</pub><doi>10.1155/APEC.5.71</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record>
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ispartof Active and passive electronic components, 1978-01, Vol.5 (2), p.71-77
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1563-5031
language eng
recordid cdi_doaj_primary_oai_doaj_org_article_e77a42761e5c4441acbabb21651b1047
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title A Screening Technique for Establishing the Stability of Metal Film Resistors
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T15%3A01%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-doaj_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Screening%20Technique%20for%20Establishing%20the%20Stability%20of%20Metal%20Film%20Resistors&rft.jtitle=Active%20and%20passive%20electronic%20components&rft.au=Goswami,%20A.%20P.&rft.date=1978-01&rft.volume=5&rft.issue=2&rft.spage=71&rft.epage=77&rft.pages=71-77&rft.issn=0882-7516&rft.eissn=1563-5031&rft_id=info:doi/10.1155/APEC.5.71&rft_dat=%3Cdoaj_cross%3Eoai_doaj_org_article_e77a42761e5c4441acbabb21651b1047%3C/doaj_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c288t-691b8f7d06f34694fc212bea7b827135928431d2de7e08d669c8671b0525af163%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true