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From millimeter to microns – IAP RAS powerful sources for various applications
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Main Authors: | , , |
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Format: | Conference Proceeding |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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ISSN: | 2100-014X 2101-6275 2100-014X |
DOI: | 10.1051/epjconf/201819500001 |