The effect of pupil transmittance on axial resolution of reflection phase microscopy

A reflection phase microscope (RPM) can be equipped with the capability of depth selection by employing a gating mechanism. However, it is difficult to achieve an axial resolution close to the diffraction limit in real implementation. Here, we systematically investigated the uneven interference cont...

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Bibliographic Details
Published in:Scientific reports 2021-11, Vol.11 (1), p.22774-22774, Article 22774
Main Authors: Hyeon, Min Gyu, Park, Kwanjun, Yang, Taeseok Daniel, Kong, Taedong, Kim, Beop-Min, Choi, Youngwoon
Format: Article
Language:English
Subjects:
639/624
639/624/1107/328
639/624/1107/328/1650
Diffraction
Gating
Humanities and Social Sciences
Microscopes
multidisciplinary
Science
Science (multidisciplinary)
Transmittance
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Summary:A reflection phase microscope (RPM) can be equipped with the capability of depth selection by employing a gating mechanism. However, it is difficult to achieve an axial resolution close to the diffraction limit in real implementation. Here, we systematically investigated the uneven interference contrast produced by pupil transmittance of the objective lens and found that it was the main cause of the practical limit that prevents the axial resolution from reaching its diffraction limit. Then we modulated the power of illumination light to obtain a uniform interference contrast over the entire pupil. Consequently, we could achieve an axial resolution fairly close to the diffraction limit set by the experimental conditions.
ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-021-02188-0