Five-analyzer Johann spectrometer for hard X-ray photon-in/photon-out spectroscopy at the Inner Shell Spectroscopy beamline at NSLS-II: design, alignment and data acquisition

Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) at the National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, the spectrometer achieves a resolution in the 0.5-2 eV range,...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2024-11, Vol.31 (Pt 6), p.1609-1621
Main Authors: Tayal, Akhil, Coburn, David Scott, Abel, Donald, Rakitin, Max, Ivashkevych, Oksana, Wlodek, Jakub, Wierzbicki, Dominik, Xu, Weihe, Nazaretski, Evgeny, Stavitski, Eli, Leshchev, Denis
Format: Article
Language:English
Subjects:
Alignment
Beamlines
Data acquisition
Johann geometry
Light sources
MATERIALS SCIENCE
Photons
Spectroscopic analysis
X-ray emission spectrometers
X-ray spectroscopy
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Summary:Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) at the National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, the spectrometer achieves a resolution in the 0.5-2 eV range, depending on the element and/or emission line, providing detailed insights into the local electronic and geometric structure of materials. It serves a diverse user community, including fields such as physical, chemical, biological, environmental and materials sciences. This article details the mechanical design, alignment procedures and data-acquisition scheme of the spectrometer, with a particular focus on the continuous asynchronous data-acquisition approach that significantly enhances experimental efficiency.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577524009342