Comparative Analysis of Conductive Paste in Electroencephalography: Evaluation of Artifact and Satisfaction

Electroencephalography (EEG) is a test that diagnoses epilepsy and measures brain function. During EEG, the space between the electrode and the skin is filled with a conductive paste to reduce the impedance between the electrode and the scalp, which helps measure the EEG signals. This study compared...

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Published in:Korean Journal of Clinical Laboratory Science 2024-03, Vol.56 (1), p.85-88
Main Authors: SONG, Jae-Hwan, KIM, Sung-Hee, KIM, Dae-Hyun
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Language:English
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electroencephalography
paste
personal satisfaction
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description Electroencephalography (EEG) is a test that diagnoses epilepsy and measures brain function. During EEG, the space between the electrode and the skin is filled with a conductive paste to reduce the impedance between the electrode and the scalp, which helps measure the EEG signals. This study compared the artifacts of the two representative conductive pastes (Ten20 and Elefix). The artifacts, noise, and satisfaction were surveyed after using the two conductive pastes. The two conductive pastes had similar artifacts and noise, but the survey results showed that the Elefix conductive paste had better satisfaction and adhesion. This result may be explained by the imprinting effect according to the experience of using the Elefix conductive paste first in the EEG class. Hence, further research is needed.
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fullrecord <record><control><sourceid>doaj_cross</sourceid><recordid>TN_cdi_doaj_primary_oai_doaj_org_article_fdc68be8dad34761b680234d51f0e187</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><doaj_id>oai_doaj_org_article_fdc68be8dad34761b680234d51f0e187</doaj_id><sourcerecordid>oai_doaj_org_article_fdc68be8dad34761b680234d51f0e187</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1555-4ebab2216f3c2c26c256c20f4db1673a2198262e454d51a9612ca691c13d3b1b3</originalsourceid><addsrcrecordid>eNo9kNtKAzEQhoMoWKpP4M2-wK6ZyaGpd6XUAwgK6nWYTbK6dbspybbQt3dbxYthmG-Yj-Fn7AZ4BUqgvP1euy5XyFFWSldQGXXGJojGlKA1nrMJzIQphZLykl3nvOacI4CRSkzY9zJutpRoaPehWPTUHXKbi9gUy9j7nTvhV8pDKNq-WHXBDSmG3oXtF3XxM9H263BXrPbU7UZF7I-XizS0DbmhoN4XbyPOx2lcXrGLhrocrv_6lH3cr96Xj-Xzy8PTcvFcOlBKlTLUVCOCboRDh9qhGos30tegZ4IQ5gY1BqmkV0BzDehIz8GB8KKGWkzZ06_XR1rbbWo3lA42UmtPIKZPS-OPrgu28U6bOhhPXsiZhlobjuLobXgAMxtd4tflUsw5hebfB9ye4ren-O0xfqu0BWuU-AEtFHq0</addsrcrecordid><sourcetype>Open Website</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Comparative Analysis of Conductive Paste in Electroencephalography: Evaluation of Artifact and Satisfaction</title><source>ROAD: Directory of Open Access Scholarly Resources</source><creator>SONG, Jae-Hwan ; KIM, Sung-Hee ; KIM, Dae-Hyun</creator><creatorcontrib>SONG, Jae-Hwan ; KIM, Sung-Hee ; KIM, Dae-Hyun</creatorcontrib><description>Electroencephalography (EEG) is a test that diagnoses epilepsy and measures brain function. During EEG, the space between the electrode and the skin is filled with a conductive paste to reduce the impedance between the electrode and the scalp, which helps measure the EEG signals. This study compared the artifacts of the two representative conductive pastes (Ten20 and Elefix). The artifacts, noise, and satisfaction were surveyed after using the two conductive pastes. The two conductive pastes had similar artifacts and noise, but the survey results showed that the Elefix conductive paste had better satisfaction and adhesion. This result may be explained by the imprinting effect according to the experience of using the Elefix conductive paste first in the EEG class. Hence, further research is needed.</description><identifier>ISSN: 1738-3544</identifier><identifier>EISSN: 2288-1662</identifier><identifier>DOI: 10.15324/kjcls.2024.56.1.85</identifier><language>eng</language><publisher>The Korean Society for Clinical Laboratory Science</publisher><subject>electroencephalography ; paste ; personal satisfaction</subject><ispartof>Korean Journal of Clinical Laboratory Science, 2024-03, Vol.56 (1), p.85-88</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1555-4ebab2216f3c2c26c256c20f4db1673a2198262e454d51a9612ca691c13d3b1b3</cites><orcidid>0009-0009-5544-2002 ; 0000-0002-8287-1939 ; 0009-0009-3833-4181</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids></links><search><creatorcontrib>SONG, Jae-Hwan</creatorcontrib><creatorcontrib>KIM, Sung-Hee</creatorcontrib><creatorcontrib>KIM, Dae-Hyun</creatorcontrib><title>Comparative Analysis of Conductive Paste in Electroencephalography: Evaluation of Artifact and Satisfaction</title><title>Korean Journal of Clinical Laboratory Science</title><description>Electroencephalography (EEG) is a test that diagnoses epilepsy and measures brain function. During EEG, the space between the electrode and the skin is filled with a conductive paste to reduce the impedance between the electrode and the scalp, which helps measure the EEG signals. This study compared the artifacts of the two representative conductive pastes (Ten20 and Elefix). The artifacts, noise, and satisfaction were surveyed after using the two conductive pastes. The two conductive pastes had similar artifacts and noise, but the survey results showed that the Elefix conductive paste had better satisfaction and adhesion. This result may be explained by the imprinting effect according to the experience of using the Elefix conductive paste first in the EEG class. Hence, further research is needed.</description><subject>electroencephalography</subject><subject>paste</subject><subject>personal satisfaction</subject><issn>1738-3544</issn><issn>2288-1662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>DOA</sourceid><recordid>eNo9kNtKAzEQhoMoWKpP4M2-wK6ZyaGpd6XUAwgK6nWYTbK6dbspybbQt3dbxYthmG-Yj-Fn7AZ4BUqgvP1euy5XyFFWSldQGXXGJojGlKA1nrMJzIQphZLykl3nvOacI4CRSkzY9zJutpRoaPehWPTUHXKbi9gUy9j7nTvhV8pDKNq-WHXBDSmG3oXtF3XxM9H263BXrPbU7UZF7I-XizS0DbmhoN4XbyPOx2lcXrGLhrocrv_6lH3cr96Xj-Xzy8PTcvFcOlBKlTLUVCOCboRDh9qhGos30tegZ4IQ5gY1BqmkV0BzDehIz8GB8KKGWkzZ06_XR1rbbWo3lA42UmtPIKZPS-OPrgu28U6bOhhPXsiZhlobjuLobXgAMxtd4tflUsw5hebfB9ye4ren-O0xfqu0BWuU-AEtFHq0</recordid><startdate>20240331</startdate><enddate>20240331</enddate><creator>SONG, Jae-Hwan</creator><creator>KIM, Sung-Hee</creator><creator>KIM, Dae-Hyun</creator><general>The Korean Society for Clinical Laboratory Science</general><scope>AAYXX</scope><scope>CITATION</scope><scope>DOA</scope><orcidid>https://orcid.org/0009-0009-5544-2002</orcidid><orcidid>https://orcid.org/0000-0002-8287-1939</orcidid><orcidid>https://orcid.org/0009-0009-3833-4181</orcidid></search><sort><creationdate>20240331</creationdate><title>Comparative Analysis of Conductive Paste in Electroencephalography: Evaluation of Artifact and Satisfaction</title><author>SONG, Jae-Hwan ; KIM, Sung-Hee ; KIM, Dae-Hyun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1555-4ebab2216f3c2c26c256c20f4db1673a2198262e454d51a9612ca691c13d3b1b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>electroencephalography</topic><topic>paste</topic><topic>personal satisfaction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SONG, Jae-Hwan</creatorcontrib><creatorcontrib>KIM, Sung-Hee</creatorcontrib><creatorcontrib>KIM, Dae-Hyun</creatorcontrib><collection>CrossRef</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>Korean Journal of Clinical Laboratory Science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SONG, Jae-Hwan</au><au>KIM, Sung-Hee</au><au>KIM, Dae-Hyun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Comparative Analysis of Conductive Paste in Electroencephalography: Evaluation of Artifact and Satisfaction</atitle><jtitle>Korean Journal of Clinical Laboratory Science</jtitle><date>2024-03-31</date><risdate>2024</risdate><volume>56</volume><issue>1</issue><spage>85</spage><epage>88</epage><pages>85-88</pages><issn>1738-3544</issn><eissn>2288-1662</eissn><abstract>Electroencephalography (EEG) is a test that diagnoses epilepsy and measures brain function. During EEG, the space between the electrode and the skin is filled with a conductive paste to reduce the impedance between the electrode and the scalp, which helps measure the EEG signals. This study compared the artifacts of the two representative conductive pastes (Ten20 and Elefix). The artifacts, noise, and satisfaction were surveyed after using the two conductive pastes. The two conductive pastes had similar artifacts and noise, but the survey results showed that the Elefix conductive paste had better satisfaction and adhesion. This result may be explained by the imprinting effect according to the experience of using the Elefix conductive paste first in the EEG class. Hence, further research is needed.</abstract><pub>The Korean Society for Clinical Laboratory Science</pub><doi>10.15324/kjcls.2024.56.1.85</doi><tpages>4</tpages><orcidid>https://orcid.org/0009-0009-5544-2002</orcidid><orcidid>https://orcid.org/0000-0002-8287-1939</orcidid><orcidid>https://orcid.org/0009-0009-3833-4181</orcidid><oa>free_for_read</oa></addata></record>
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subjects electroencephalography
paste
personal satisfaction
title Comparative Analysis of Conductive Paste in Electroencephalography: Evaluation of Artifact and Satisfaction
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T20%3A48%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-doaj_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Comparative%20Analysis%20of%20Conductive%20Paste%20in%20Electroencephalography:%20Evaluation%20of%20Artifact%20and%20Satisfaction&rft.jtitle=Korean%20Journal%20of%20Clinical%20Laboratory%20Science&rft.au=SONG,%20Jae-Hwan&rft.date=2024-03-31&rft.volume=56&rft.issue=1&rft.spage=85&rft.epage=88&rft.pages=85-88&rft.issn=1738-3544&rft.eissn=2288-1662&rft_id=info:doi/10.15324/kjcls.2024.56.1.85&rft_dat=%3Cdoaj_cross%3Eoai_doaj_org_article_fdc68be8dad34761b680234d51f0e187%3C/doaj_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c1555-4ebab2216f3c2c26c256c20f4db1673a2198262e454d51a9612ca691c13d3b1b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true