SIMPLIFIED ENGINEERING TECHNIQUES FOR PREDICTING DIODE TREE RESPONSES

The purpose of the project is to determine the feasibility of correlating radiation-induced equilibrium photocurrent, in typical silicon switching diodes, to non-destructively measurable diode parameters. Theoretical relations are developed which relate the diode depletion and diffusion components o...

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Bibliographic Details
Main Authors: Bell, J. E, Carr, E. A, Handley, W. V, Walker, K. R
Format: Report
Language:English
Subjects:
AVALANCHE DIODES
CAPACITANCE
CAPACITANCE BRIDGES
DAMAGE
DOSIMETERS
Electrical and Electronic Equipment
ELECTRICAL PROPERTIES
FEASIBILITY STUDIES
LEAKAGE(ELECTRICAL)
MATHEMATICAL PREDICTION
MEASUREMENT
NONDESTRUCTIVE TESTING
OSCILLATORS
PHOTOELECTRIC EFFECT
PULSE GENERATORS
RADIATION EFFECTS
SEMICONDUCTOR DIODES
SILICON
SPECIFICATIONS
TEST EQUIPMENT
TEST METHODS
THEORY
TRANSIENT RADIATION EFFECTS(ELECTRONICS)
TRANSISTORS
VOLTAGE
WIRING DIAGRAMS
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Summary:The purpose of the project is to determine the feasibility of correlating radiation-induced equilibrium photocurrent, in typical silicon switching diodes, to non-destructively measurable diode parameters. Theoretical relations are developed which relate the diode depletion and diffusion components of photocurrent to known physical constants and nondestructively measurable diode electrical parameters. Test circuits and methods are developed for properly measuring the required electrical diode parameters. The agreement between calculated and measured photocurrents for the group of 46 diodes tested established the feasibility of the developed prediction method. (Author)