Predicted and Measured Depth Dose Profiles for Pulsed Electron Spectra

Experimentally measured depth dose profiles for several materials are compared with the theoretical profiles calculated by the electron transport computer code ZEBRA. The experimental profiles were obtained using a new technique. The samples of the materials were exposed to the pulsed electron beam...

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Bibliographic Details
Main Authors: Schallhorn,Dale R, Buxton,Lawrence D
Format: Report
Language:English
Subjects:
ALUMINUM
COPPER
ELECTRON IRRADIATION
GERMANIUM
GOLD
INDIUM ANTIMONIDES
INTERFEROMETERS
LASER INTERFEROMETERS
LASERS
RADIATION DAMAGE
Radioactiv, Radioactive Wastes & Fission Prod
SILICON
Solid State Physics
SURFACE PROPERTIES
TANTALUM
ZEBRA COMPUTER CODE
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Summary:Experimentally measured depth dose profiles for several materials are compared with the theoretical profiles calculated by the electron transport computer code ZEBRA. The experimental profiles were obtained using a new technique. The samples of the materials were exposed to the pulsed electron beam from the flash x-ray machine at HDL. The surface motion induced by the exposure was measured with a laser interferometer. These measured responses were converted to velocity histories that can be related to the depth dose profiles. The depth dose profiles of nine materials with atomic numbers ranging from 13 to 79 were obtained. For three of these materials, profiles were obtained for more than one electron spectrum. In general, the measured and calculated profiles agree with each other well enough to demonstrate the applicability of this experimental technique to a wide range of materials and electron spectra. (Author)