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300C SEMICONDUCTOR FOR POWER DEVICES
The successful design and development of a 50-ampere rectifier with reverse breakdown over 150 volts, operable in a 300C ambient temperature, is described. High-operating-temperature and reverse-breakdown requirements led to the choice of gallium arsenide and gallium arsenide-phosphide as the semico...
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creator | Enstrom, R. E Krassner, L. A |
description | The successful design and development of a 50-ampere rectifier with reverse breakdown over 150 volts, operable in a 300C ambient temperature, is described. High-operating-temperature and reverse-breakdown requirements led to the choice of gallium arsenide and gallium arsenide-phosphide as the semiconductor materials employed. The rectifier junctions were grown by vapor phase epitaxial techniques, and very-high breakdown voltage was achieved. Growth of defect-free large-area (0.175-mil diameter) junctions was a major accomplishment. A complete process for rectifier fabrication was developed, including etching, contacting, mounting, and junction coating techniques. The results of mechanical, electrical, and environmental tests are presented. (Author) |
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A ; RADIO CORP OF AMERICA SOMERVILLE NJ ELECTRONIC COMPONENTS AND DEVICES</creatorcontrib><description>The successful design and development of a 50-ampere rectifier with reverse breakdown over 150 volts, operable in a 300C ambient temperature, is described. High-operating-temperature and reverse-breakdown requirements led to the choice of gallium arsenide and gallium arsenide-phosphide as the semiconductor materials employed. The rectifier junctions were grown by vapor phase epitaxial techniques, and very-high breakdown voltage was achieved. Growth of defect-free large-area (0.175-mil diameter) junctions was a major accomplishment. A complete process for rectifier fabrication was developed, including etching, contacting, mounting, and junction coating techniques. The results of mechanical, electrical, and environmental tests are presented. (Author)</description><language>eng</language><subject>ARSENIC GALLIUM PHOSPHIDE ; BREAKDOWN VOLTAGE ; ELECTRIC TERMINALS ; Electrical and Electronic Equipment ; ELECTRICAL PROPERTIES ; ENVIRONMENTAL TESTS ; EPITAXIAL GROWTH ; ETCHED CRYSTALS ; GALLIUM ARSENIDES ; HIGH TEMPERATURE ; MANUFACTURING ; MECHANICAL PROPERTIES ; RECTIFIERS ; SEMICONDUCTOR DIODES ; SEMICONDUCTOR JUNCTIONS ; Solid State Physics</subject><creationdate>1968</creationdate><rights>APPROVED FOR PUBLIC RELEASE</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,776,881,27544,27545</link.rule.ids><linktorsrc>$$Uhttps://apps.dtic.mil/sti/citations/AD0827343$$EView_record_in_DTIC$$FView_record_in_$$GDTIC$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Enstrom, R. E</creatorcontrib><creatorcontrib>Krassner, L. A</creatorcontrib><creatorcontrib>RADIO CORP OF AMERICA SOMERVILLE NJ ELECTRONIC COMPONENTS AND DEVICES</creatorcontrib><title>300C SEMICONDUCTOR FOR POWER DEVICES</title><description>The successful design and development of a 50-ampere rectifier with reverse breakdown over 150 volts, operable in a 300C ambient temperature, is described. High-operating-temperature and reverse-breakdown requirements led to the choice of gallium arsenide and gallium arsenide-phosphide as the semiconductor materials employed. The rectifier junctions were grown by vapor phase epitaxial techniques, and very-high breakdown voltage was achieved. Growth of defect-free large-area (0.175-mil diameter) junctions was a major accomplishment. A complete process for rectifier fabrication was developed, including etching, contacting, mounting, and junction coating techniques. The results of mechanical, electrical, and environmental tests are presented. (Author)</description><subject>ARSENIC GALLIUM PHOSPHIDE</subject><subject>BREAKDOWN VOLTAGE</subject><subject>ELECTRIC TERMINALS</subject><subject>Electrical and Electronic Equipment</subject><subject>ELECTRICAL PROPERTIES</subject><subject>ENVIRONMENTAL TESTS</subject><subject>EPITAXIAL GROWTH</subject><subject>ETCHED CRYSTALS</subject><subject>GALLIUM ARSENIDES</subject><subject>HIGH TEMPERATURE</subject><subject>MANUFACTURING</subject><subject>MECHANICAL PROPERTIES</subject><subject>RECTIFIERS</subject><subject>SEMICONDUCTOR DIODES</subject><subject>SEMICONDUCTOR JUNCTIONS</subject><subject>Solid State Physics</subject><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>1968</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNrjZFAxNjBwVgh29fV09vdzCXUO8Q9ScAPiAP9w1yAFF9cwT2fXYB4G1rTEnOJUXijNzSDj5hri7KGbUpKZHF9ckpmXWhLv6GJgYWRubGJsTEAaAAKJH8c</recordid><startdate>196802</startdate><enddate>196802</enddate><creator>Enstrom, R. E</creator><creator>Krassner, L. A</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>196802</creationdate><title>300C SEMICONDUCTOR FOR POWER DEVICES</title><author>Enstrom, R. E ; Krassner, L. A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_AD08273433</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>1968</creationdate><topic>ARSENIC GALLIUM PHOSPHIDE</topic><topic>BREAKDOWN VOLTAGE</topic><topic>ELECTRIC TERMINALS</topic><topic>Electrical and Electronic Equipment</topic><topic>ELECTRICAL PROPERTIES</topic><topic>ENVIRONMENTAL TESTS</topic><topic>EPITAXIAL GROWTH</topic><topic>ETCHED CRYSTALS</topic><topic>GALLIUM ARSENIDES</topic><topic>HIGH TEMPERATURE</topic><topic>MANUFACTURING</topic><topic>MECHANICAL PROPERTIES</topic><topic>RECTIFIERS</topic><topic>SEMICONDUCTOR DIODES</topic><topic>SEMICONDUCTOR JUNCTIONS</topic><topic>Solid State Physics</topic><toplevel>online_resources</toplevel><creatorcontrib>Enstrom, R. E</creatorcontrib><creatorcontrib>Krassner, L. A</creatorcontrib><creatorcontrib>RADIO CORP OF AMERICA SOMERVILLE NJ ELECTRONIC COMPONENTS AND DEVICES</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Enstrom, R. E</au><au>Krassner, L. A</au><aucorp>RADIO CORP OF AMERICA SOMERVILLE NJ ELECTRONIC COMPONENTS AND DEVICES</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>300C SEMICONDUCTOR FOR POWER DEVICES</btitle><date>1968-02</date><risdate>1968</risdate><abstract>The successful design and development of a 50-ampere rectifier with reverse breakdown over 150 volts, operable in a 300C ambient temperature, is described. High-operating-temperature and reverse-breakdown requirements led to the choice of gallium arsenide and gallium arsenide-phosphide as the semiconductor materials employed. The rectifier junctions were grown by vapor phase epitaxial techniques, and very-high breakdown voltage was achieved. Growth of defect-free large-area (0.175-mil diameter) junctions was a major accomplishment. A complete process for rectifier fabrication was developed, including etching, contacting, mounting, and junction coating techniques. The results of mechanical, electrical, and environmental tests are presented. (Author)</abstract><oa>free_for_read</oa></addata></record> |
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subjects | ARSENIC GALLIUM PHOSPHIDE BREAKDOWN VOLTAGE ELECTRIC TERMINALS Electrical and Electronic Equipment ELECTRICAL PROPERTIES ENVIRONMENTAL TESTS EPITAXIAL GROWTH ETCHED CRYSTALS GALLIUM ARSENIDES HIGH TEMPERATURE MANUFACTURING MECHANICAL PROPERTIES RECTIFIERS SEMICONDUCTOR DIODES SEMICONDUCTOR JUNCTIONS Solid State Physics |
title | 300C SEMICONDUCTOR FOR POWER DEVICES |
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