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Development of Microwave Semiconductor Noise Diode and Diode Holder
A microwave integrated circuit, solid state noise source has been designed and tested between the frequency of 8 to 12.4 GHz. Results of the output spectrum noise measurements are presented for temperature variations of -54C to +85C. (Author) See also Quarterly rept. no. 1, AD-858 186.
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Format: | Report |
Language: | English |
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Online Access: | Request full text |
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Summary: | A microwave integrated circuit, solid state noise source has been designed and tested between the frequency of 8 to 12.4 GHz. Results of the output spectrum noise measurements are presented for temperature variations of -54C to +85C. (Author)
See also Quarterly rept. no. 1, AD-858 186. |
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