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Development of Microwave Semiconductor Noise Diode and Diode Holder

A microwave integrated circuit, solid state noise source has been designed and tested between the frequency of 8 to 12.4 GHz. Results of the output spectrum noise measurements are presented for temperature variations of -54C to +85C. (Author) See also Quarterly rept. no. 1, AD-858 186.

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Bibliographic Details
Main Author: Collinet,J. C
Format: Report
Language:English
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Summary:A microwave integrated circuit, solid state noise source has been designed and tested between the frequency of 8 to 12.4 GHz. Results of the output spectrum noise measurements are presented for temperature variations of -54C to +85C. (Author) See also Quarterly rept. no. 1, AD-858 186.