Loading…
Quantification of Material State using Reflectance FTIR Spectroscopy (Preprint)
A common, frequently violated, assumption implicit in many data analysis techniques is that data is of the same quality across observations. The effect of this assumption is discussed and demonstrated in the example of FTIR of CMCs. An alternative analysis, which incorporates the variation in the qu...
Saved in:
Main Authors: | , , , |
---|---|
Format: | Report |
Language: | English |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | |
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Criner,Amanda K Henry,Christine Imel,Megan King,Derek |
description | A common, frequently violated, assumption implicit in many data analysis techniques is that data is of the same quality across observations. The effect of this assumption is discussed and demonstrated in the example of FTIR of CMCs. An alternative analysis, which incorporates the variation in the quality of the data, is presented. A comparison between the analyses is used to demonstrate this difference.
Review of Progress in Quantitative Nondestructive Evaluation , 01 Jan 0001, 01 Jan 0001, |
format | report |
fullrecord | <record><control><sourceid>dtic_1RU</sourceid><recordid>TN_cdi_dtic_stinet_AD1043419</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>AD1043419</sourcerecordid><originalsourceid>FETCH-dtic_stinet_AD10434193</originalsourceid><addsrcrecordid>eNrjZPAPLE3MK8lMy0xOLMnMz1PIT1PwTSxJLcpMzFEILgGyFEqLM_PSFYJS03JSk0sS85JTFdxCPIMUgguA3KL84uT8gkoFjYCi1IKizLwSTR4G1rTEnOJUXijNzSDj5hri7KGbUpKZHF9ckpmXWhLv6GJoYGJsYmhpTEAaAANDM2o</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>report</recordtype></control><display><type>report</type><title>Quantification of Material State using Reflectance FTIR Spectroscopy (Preprint)</title><source>DTIC Technical Reports</source><creator>Criner,Amanda K ; Henry,Christine ; Imel,Megan ; King,Derek</creator><creatorcontrib>Criner,Amanda K ; Henry,Christine ; Imel,Megan ; King,Derek ; AFRL Materials and Manufacturing Directorate Wright Patterson Air Force Base United States</creatorcontrib><description>A common, frequently violated, assumption implicit in many data analysis techniques is that data is of the same quality across observations. The effect of this assumption is discussed and demonstrated in the example of FTIR of CMCs. An alternative analysis, which incorporates the variation in the quality of the data, is presented. A comparison between the analyses is used to demonstrate this difference.
Review of Progress in Quantitative Nondestructive Evaluation , 01 Jan 0001, 01 Jan 0001,</description><language>eng</language><creationdate>2017</creationdate><rights>Approved For Public Release</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,780,885,27567,27568</link.rule.ids><linktorsrc>$$Uhttps://apps.dtic.mil/sti/citations/AD1043419$$EView_record_in_DTIC$$FView_record_in_$$GDTIC$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Criner,Amanda K</creatorcontrib><creatorcontrib>Henry,Christine</creatorcontrib><creatorcontrib>Imel,Megan</creatorcontrib><creatorcontrib>King,Derek</creatorcontrib><creatorcontrib>AFRL Materials and Manufacturing Directorate Wright Patterson Air Force Base United States</creatorcontrib><title>Quantification of Material State using Reflectance FTIR Spectroscopy (Preprint)</title><description>A common, frequently violated, assumption implicit in many data analysis techniques is that data is of the same quality across observations. The effect of this assumption is discussed and demonstrated in the example of FTIR of CMCs. An alternative analysis, which incorporates the variation in the quality of the data, is presented. A comparison between the analyses is used to demonstrate this difference.
Review of Progress in Quantitative Nondestructive Evaluation , 01 Jan 0001, 01 Jan 0001,</description><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>2017</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNrjZPAPLE3MK8lMy0xOLMnMz1PIT1PwTSxJLcpMzFEILgGyFEqLM_PSFYJS03JSk0sS85JTFdxCPIMUgguA3KL84uT8gkoFjYCi1IKizLwSTR4G1rTEnOJUXijNzSDj5hri7KGbUpKZHF9ckpmXWhLv6GJoYGJsYmhpTEAaAANDM2o</recordid><startdate>20171208</startdate><enddate>20171208</enddate><creator>Criner,Amanda K</creator><creator>Henry,Christine</creator><creator>Imel,Megan</creator><creator>King,Derek</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>20171208</creationdate><title>Quantification of Material State using Reflectance FTIR Spectroscopy (Preprint)</title><author>Criner,Amanda K ; Henry,Christine ; Imel,Megan ; King,Derek</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_AD10434193</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>2017</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Criner,Amanda K</creatorcontrib><creatorcontrib>Henry,Christine</creatorcontrib><creatorcontrib>Imel,Megan</creatorcontrib><creatorcontrib>King,Derek</creatorcontrib><creatorcontrib>AFRL Materials and Manufacturing Directorate Wright Patterson Air Force Base United States</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Criner,Amanda K</au><au>Henry,Christine</au><au>Imel,Megan</au><au>King,Derek</au><aucorp>AFRL Materials and Manufacturing Directorate Wright Patterson Air Force Base United States</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>Quantification of Material State using Reflectance FTIR Spectroscopy (Preprint)</btitle><date>2017-12-08</date><risdate>2017</risdate><abstract>A common, frequently violated, assumption implicit in many data analysis techniques is that data is of the same quality across observations. The effect of this assumption is discussed and demonstrated in the example of FTIR of CMCs. An alternative analysis, which incorporates the variation in the quality of the data, is presented. A comparison between the analyses is used to demonstrate this difference.
Review of Progress in Quantitative Nondestructive Evaluation , 01 Jan 0001, 01 Jan 0001,</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_dtic_stinet_AD1043419 |
source | DTIC Technical Reports |
title | Quantification of Material State using Reflectance FTIR Spectroscopy (Preprint) |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T20%3A02%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-dtic_1RU&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=unknown&rft.btitle=Quantification%20of%20Material%20State%20using%20Reflectance%20FTIR%20Spectroscopy%20(Preprint)&rft.au=Criner,Amanda%20K&rft.aucorp=AFRL%20Materials%20and%20Manufacturing%20Directorate%20Wright%20Patterson%20Air%20Force%20Base%20United%20States&rft.date=2017-12-08&rft_id=info:doi/&rft_dat=%3Cdtic_1RU%3EAD1043419%3C/dtic_1RU%3E%3Cgrp_id%3Ecdi_FETCH-dtic_stinet_AD10434193%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |