Manufacturing Methods and Technology Engineering High Efficiency, High Power Gallium Arsenide Read-Type IMPATT Diodes

Group B testing of the confirmatory sample diodes was completed during the period, ending that phase of the program. All devices tested met specifications. Data is included herein. The Read profile wafers for the pilot production diodes were fabricated and met specifications. They were delivered to...

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Bibliographic Details
Main Authors: Chalifour,H R, Steele,S R
Format: Report
Language:English
Subjects:
BREAKDOWN(ELECTRONIC THRESHOLD)
Electrical and Electronic Equipment
Fabrication Metallurgy
GALLIUM ARSENIDES
HEAT SINKS
IMPATT DIODES
JUNCTION DIODES
KU BAND
LIFE TESTS
LPN-DA-2759738
MICROWAVE OSCILLATORS
PILOT PLANTS
POWER SUPPLIES
PRODUCTION ENGINEERING
SAMPLING
SCHOTTKY BARRIER DEVICES
SPECIFICATIONS
WAFERS
X BAND
YIELD
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Description
Summary:Group B testing of the confirmatory sample diodes was completed during the period, ending that phase of the program. All devices tested met specifications. Data is included herein. The Read profile wafers for the pilot production diodes were fabricated and met specifications. They were delivered to the production line. Wafer characterization data is included herein, as well as evaluation data on the first two wafers subsequent to sample diode assembly on the production line. The fifth X-band life test was completed. The sixth X and Ku-band life tests were also completed. Results are discussed herein. (Author)