Techniques of Microprocessor Testing and SEU (Single Event Upset)-Rate Prediction

Several different approaches have been used in the past to assess the vulnerability of microprocessors to SEU. In this report we discuss the advantages and disadvantages of each of these test methods, and address the question of how the microprocessor test results can be used to estimate upset rate...

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Bibliographic Details
Main Authors: Koga,Rokutaro, Kolasinski,Wojciech A, Marra,Michael T
Format: Report
Language:English
Subjects:
4- Bit Slice Processors
AM-2901B processors
Computer Hardware
ERRORS
GCM(Golden Chip Method)
Latchups
M-6800 Microprocessors
MATHEMATICAL PREDICTION
MD-2815 Processors
MEMORY DEVICES
MICROCIRCUITS
Microcontrollers
MICROPROCESSORS
RADIATION HARDENING
SEU(Single Event Upsets)
SIMULATION
Soft Errors
SPACEBORNE
SYNCHRONOUS SATELLITES
SYSTEMS ENGINEERING
Unmanned Spacecraft
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Summary:Several different approaches have been used in the past to assess the vulnerability of microprocessors to SEU. In this report we discuss the advantages and disadvantages of each of these test methods, and address the question of how the microprocessor test results can be used to estimate upset rate in space. Finally, as an application of the above techniques, we present the test results and predicted upset rates in synchronous orbit for a selected group of microprocessors.