Characterization of Electromagnetic Fields in an Extended Chamber at the Short Pulse Experimental Electron Device (Speed) Simulator

The electromagnetic (EM) fields present during testing in a large vacuum chamber at the Short Pulse Experimental Electron Device (SPEED) facility are observed and measured using B-dot and D-dot detectors. Because the cathode of the vacuum diode is exposed to the chamber, the EM fields are significan...

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Bibliographic Details
Main Author: Hunt, Kenneth K
Format: Report
Language:English
Subjects:
CURRENTS
DETECTORS
DIODES
ELECTRIC CURRENT
ELECTRIC FIELDS
Electricity and Magnetism
ELECTROMAGNETIC FIELDS
ELECTROMAGNETIC PULSES
Electromagnetic Shielding
ELECTRONS
FIELDS
FISCAL YEAR 93
FOURIER ANALYSIS
MAGNETIC FIELDS
OSCILLOSCOPES
PE62601F
PULSE GENERATORS
SHIELDING
SIGNALS
SIMULATORS
SPECTRA
SPEED(SHORT PULSE EXPERIMENTAL ELECTRON DEVICE)
SURVIVABILITY
TANTALUM
VACUUM CHAMBERS
WUPL8809TBAA
X RAY SIMULATOR
X RAYS
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Description
Summary:The electromagnetic (EM) fields present during testing in a large vacuum chamber at the Short Pulse Experimental Electron Device (SPEED) facility are observed and measured using B-dot and D-dot detectors. Because the cathode of the vacuum diode is exposed to the chamber, the EM fields are significant and could adversely affect nonfaraday-shielded experiments. The differential magnetic fields and electric fields are nearly isotopically distributed, build to a maximum at 100-200 ns of 7.9 x 10 to the 9th power A/m-s and 9 x 10 to the 10th power V/m-s, respectively, then decay for approximately 1000 ns. Fourier analysis of spectra gives frequencies (460, 550, and 60 MHz) characteristic of the dimensions of the chamber and of electrons rebounding between the target and the pulse generators. A collimated damper is designed which should eliminate most EM fields in future tests in this configuration.