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High Purity ZnS/Ge Interference Filter Emittance
Data are presented that demonstrate infrared thin film interference filters made with CVD zinc sulfide start materials exhibit significantly higher spectral emittance than those made with IRTRAN II. A simple radiometric model and comparative analysis are discussed that indicates elevated filter emit...
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creator | Clement, Russel E Elliott, Clyde Fisher, Jon |
description | Data are presented that demonstrate infrared thin film interference filters made with CVD zinc sulfide start materials exhibit significantly higher spectral emittance than those made with IRTRAN II. A simple radiometric model and comparative analysis are discussed that indicates elevated filter emittance levels may adversely impact infrared sensors and seekers designed to operate in the 7 - 15 micron region. It is expected that systems that incorporate filters made with CVD ZnS could exhibit anomalous high backgrounds, image blurring or optical cross talk.
Prepared in collaboration with Mission Research Corp., Huntsville, AL. Presented at Proceedings of 1999 Meeting of the MSS Specialty Group on Infrared Materials, v1 n1 p129-141, Oct 99. |
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Prepared in collaboration with Mission Research Corp., Huntsville, AL. Presented at Proceedings of 1999 Meeting of the MSS Specialty Group on Infrared Materials, v1 n1 p129-141, Oct 99.</description><language>eng</language><subject>ANTIMISSILE DEFENSE SYSTEMS ; CHEMICAL VAPOR DEPOSITION ; COMMAND CONTROL COMMUNICATIONS ; Infrared Detection and Detectors ; INFRARED DETECTORS ; INFRARED FILTERS ; INFRARED SEEKERS ; Optics ; PE47700D ; RADIOMETRY ; THIN FILMS ; ZINC SULFIDES</subject><creationdate>1999</creationdate><rights>APPROVED FOR PUBLIC RELEASE</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,780,885,27565,27566</link.rule.ids><linktorsrc>$$Uhttps://apps.dtic.mil/sti/citations/ADA376584$$EView_record_in_DTIC$$FView_record_in_$$GDTIC$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Clement, Russel E</creatorcontrib><creatorcontrib>Elliott, Clyde</creatorcontrib><creatorcontrib>Fisher, Jon</creatorcontrib><creatorcontrib>SPACE AND NAVAL WARFARE SYSTEMS CENTER SAN DIEGO CA</creatorcontrib><title>High Purity ZnS/Ge Interference Filter Emittance</title><description>Data are presented that demonstrate infrared thin film interference filters made with CVD zinc sulfide start materials exhibit significantly higher spectral emittance than those made with IRTRAN II. A simple radiometric model and comparative analysis are discussed that indicates elevated filter emittance levels may adversely impact infrared sensors and seekers designed to operate in the 7 - 15 micron region. It is expected that systems that incorporate filters made with CVD ZnS could exhibit anomalous high backgrounds, image blurring or optical cross talk.
Prepared in collaboration with Mission Research Corp., Huntsville, AL. Presented at Proceedings of 1999 Meeting of the MSS Specialty Group on Infrared Materials, v1 n1 p129-141, Oct 99.</description><subject>ANTIMISSILE DEFENSE SYSTEMS</subject><subject>CHEMICAL VAPOR DEPOSITION</subject><subject>COMMAND CONTROL COMMUNICATIONS</subject><subject>Infrared Detection and Detectors</subject><subject>INFRARED DETECTORS</subject><subject>INFRARED FILTERS</subject><subject>INFRARED SEEKERS</subject><subject>Optics</subject><subject>PE47700D</subject><subject>RADIOMETRY</subject><subject>THIN FILMS</subject><subject>ZINC SULFIDES</subject><fulltext>true</fulltext><rsrctype>report</rsrctype><creationdate>1999</creationdate><recordtype>report</recordtype><sourceid>1RU</sourceid><recordid>eNrjZDDwyEzPUAgoLcosqVSIygvWd09V8MwrSS1KSy1KzUtOVXDLzAHyFFxzM0tKEoECPAysaYk5xam8UJqbQcbNNcTZQzelJDM5vrgkMy-1JN7RxdHY3MzUwsSYgDQAZb4n0g</recordid><startdate>19991001</startdate><enddate>19991001</enddate><creator>Clement, Russel E</creator><creator>Elliott, Clyde</creator><creator>Fisher, Jon</creator><scope>1RU</scope><scope>BHM</scope></search><sort><creationdate>19991001</creationdate><title>High Purity ZnS/Ge Interference Filter Emittance</title><author>Clement, Russel E ; Elliott, Clyde ; Fisher, Jon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-dtic_stinet_ADA3765843</frbrgroupid><rsrctype>reports</rsrctype><prefilter>reports</prefilter><language>eng</language><creationdate>1999</creationdate><topic>ANTIMISSILE DEFENSE SYSTEMS</topic><topic>CHEMICAL VAPOR DEPOSITION</topic><topic>COMMAND CONTROL COMMUNICATIONS</topic><topic>Infrared Detection and Detectors</topic><topic>INFRARED DETECTORS</topic><topic>INFRARED FILTERS</topic><topic>INFRARED SEEKERS</topic><topic>Optics</topic><topic>PE47700D</topic><topic>RADIOMETRY</topic><topic>THIN FILMS</topic><topic>ZINC SULFIDES</topic><toplevel>online_resources</toplevel><creatorcontrib>Clement, Russel E</creatorcontrib><creatorcontrib>Elliott, Clyde</creatorcontrib><creatorcontrib>Fisher, Jon</creatorcontrib><creatorcontrib>SPACE AND NAVAL WARFARE SYSTEMS CENTER SAN DIEGO CA</creatorcontrib><collection>DTIC Technical Reports</collection><collection>DTIC STINET</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Clement, Russel E</au><au>Elliott, Clyde</au><au>Fisher, Jon</au><aucorp>SPACE AND NAVAL WARFARE SYSTEMS CENTER SAN DIEGO CA</aucorp><format>book</format><genre>unknown</genre><ristype>RPRT</ristype><btitle>High Purity ZnS/Ge Interference Filter Emittance</btitle><date>1999-10-01</date><risdate>1999</risdate><abstract>Data are presented that demonstrate infrared thin film interference filters made with CVD zinc sulfide start materials exhibit significantly higher spectral emittance than those made with IRTRAN II. A simple radiometric model and comparative analysis are discussed that indicates elevated filter emittance levels may adversely impact infrared sensors and seekers designed to operate in the 7 - 15 micron region. It is expected that systems that incorporate filters made with CVD ZnS could exhibit anomalous high backgrounds, image blurring or optical cross talk.
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subjects | ANTIMISSILE DEFENSE SYSTEMS CHEMICAL VAPOR DEPOSITION COMMAND CONTROL COMMUNICATIONS Infrared Detection and Detectors INFRARED DETECTORS INFRARED FILTERS INFRARED SEEKERS Optics PE47700D RADIOMETRY THIN FILMS ZINC SULFIDES |
title | High Purity ZnS/Ge Interference Filter Emittance |
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