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Microstructural Characterization of Foil-Gage Haynes (register trademark) 230 (registered trademark) (Preprint)
The microstructures of foil-gage Haynes 230 with thicknesses of 125 and 500 um (5 and 20 mils, respectively) were characterized using optical, scanning electron (SEM) and electron backscattered diffraction (EBSD) microscopy. The average gamma grain size was shown to decrease with foil thickness due...
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Main Authors: | , , , |
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Format: | Report |
Language: | English |
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Online Access: | Request full text |
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Summary: | The microstructures of foil-gage Haynes 230 with thicknesses of 125 and 500 um (5 and 20 mils, respectively) were characterized using optical, scanning electron (SEM) and electron backscattered diffraction (EBSD) microscopy. The average gamma grain size was shown to decrease with foil thickness due to increased plastic deformation and grain recrystallization. Strings of carbides oriented parallel to the rolling direction and located within the equiaxed gamma grains were observed. Room temperature tensile tests revealed a Hall-Petch effect with increasing yield strength associated with decreasing gamma grain size. Tensile properties were very similar between longitudinal and transverse specimens of each thickness. Fractography of the tensile specimens revealed evidence of significant plasticity, localized grain boundary tearing and large carbide fracture for each thickness and orientation.
Submitted for Publication in the Journal of Materials Science and Engineering A. |
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