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Metamorphic InAsSb-based Barrier Photodetectors for the Long Wave Infrared Region
InAs(0.6)Sb(0.4)/Al(0.75)In(0.25)Sb-based barrier photodetectors were grown metamorphically on compositionally graded Ga(1-x) InxSb buffer layers and GaSb substrates by molecular beam epitaxy. At the wavelength of 8 micormeter and T=150K, devices with 1-micrometer thick absorbers demonstrated an ext...
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Main Authors: | , , , , , , , |
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Format: | Report |
Language: | English |
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Online Access: | Request full text |
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Summary: | InAs(0.6)Sb(0.4)/Al(0.75)In(0.25)Sb-based barrier photodetectors were grown metamorphically on compositionally graded Ga(1-x) InxSb buffer layers and GaSb substrates by molecular beam epitaxy. At the wavelength of 8 micormeter and T=150K, devices with 1-micrometer thick absorbers demonstrated an external quantum efficiency of 18% under a bias voltage of 0.45 V.
The original document contains color images. Published in Applied Physics Letters, v103 p051120-1/051120-3, 2013. |
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