Loading…

Characterization of Microstructure with Low Frequency Electromagnetic Techniques (Postprint)

A new computational method for characterizing the relationship between surface crystallography and electrical conductivity in anisotropic materials with low frequency electromagnetic techniques is presented. The method is discussed from the standpoint of characterizing the orientation of a single gr...

Full description

Saved in:
Bibliographic Details
Main Authors: Cherry, Matthew R, Sathish, Shamachary, Cherry, Aaron J, Pilchak, Adam L, Blodgett, Mark P
Format: Report
Language:English
Subjects:
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A new computational method for characterizing the relationship between surface crystallography and electrical conductivity in anisotropic materials with low frequency electromagnetic techniques is presented. The method is discussed from the standpoint of characterizing the orientation of a single grain, as well as characterizing statistical information about grain ensembles in the microstructure. Large-area electron backscatter diffraction (EBSD) data was obtained and used in conjunction with a synthetic aperture approach to simulate the eddy current response of beta annealed Ti-6Al-4V. Experimental eddy current results are compared to the computed eddy current approximations based on electron backscatter diffraction (EBSD) data, demonstrating good agreement. The detectability of notches in the presence of noise from microstructure is analyzed with the described simulation method and advantages and limitations of this method are discussed relative to other NDE techniques for such analysis. Published in AIP Conf. Proc., v1581 p1456-1462, 2014. Prepared in collaboration with the University of Dayton Research Institute, Dayton, OH, and the Southwestern Ohio Council for Higher Education, Dayton.