Refractive index of CdTe1-xSex thin films estimated by Swanepoel's method

CdTe1-xSex thin films were deposited on a quartz and silicon substrate using the method of high-frequency magnetron sputtering. The chemical composition analysis and crystal structure refinement were examined using X-ray fluorescence spectroscopy and X-ray diffraction data. CdTe1-xSex thin films wit...

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Bibliographic Details
Published in:Optical materials 2025-01, Vol.158, Article 116500
Main Authors: Kashuba, A., Andriyevsky, B., Rudysh, M., Semkiv, I., Shchepanskyi, P.
Format: Article
Language:English
Subjects:
Band gap
Optical transmission
Real part of dielectric function
Refractive index
Solar cell
Thin film
Online Access:Get full text
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Summary:CdTe1-xSex thin films were deposited on a quartz and silicon substrate using the method of high-frequency magnetron sputtering. The chemical composition analysis and crystal structure refinement were examined using X-ray fluorescence spectroscopy and X-ray diffraction data. CdTe1-xSex thin films with x 
ISSN:0925-3467
DOI:10.1016/j.optmat.2024.116500