Critical evaluation of the potential of radiofrequency pulsed glow discharge--time-of-flight mass spectrometry for depth-profile analysis of innovative materials

The combination of radiofrequency pulsed glow discharge (RF-PGD) analytical plasmas with time-of-flight mass spectrometry (TOFMS) has promoted the applicability of this ion source to direct analysis of innovative materials. In this sense, this emerging technique enables multi-elemental depth profili...

Full description

Saved in:
Bibliographic Details
Published in:Analytical and bioanalytical chemistry 2013-06, Vol.405 (17), p.5655
Main Authors: Pisonero, Jorge, Bordel, Nerea, de Vega, Claudia Gonzalez, Fernandez, Beatriz, Pereiro, Rosario, Sanz-Medel, Alfredo
Format: Article
Language:English
Subjects:
Composite materials
Identification and classification
Methods
Properties
Radio waves
Time-of-flight mass spectrometry
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The combination of radiofrequency pulsed glow discharge (RF-PGD) analytical plasmas with time-of-flight mass spectrometry (TOFMS) has promoted the applicability of this ion source to direct analysis of innovative materials. In this sense, this emerging technique enables multi-elemental depth profiling with high depth resolution and sensitivity, and simultaneous production of elemental, structural, and molecular information. The analytical potential and trends of this technique are critically presented, including comparison with other complementary and well-established techniques (e.g. SIMS, GD-OES, etc.). An overview of recent applications of RF-PGD-TOFMS is given, including analysis of nanostructured materials, coated-glasses, photovoltaic materials, and polymer coatings Keywords Glow discharge * Time-of-flight * Depth profiling * Thin layers * Near-surface techniques
ISSN:1618-2642
DOI:10.1007/s00216-013-6914-l