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Delay testable logical circuit design

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Bibliographic Details
Published in:Russian physics journal 2013-04, Vol.55 (11), p.1370-1372
Main Authors: Matrosova, A. Yu, Nikolaeva, E. A., Rumyantseva, E. V.
Format: Article
Language:English
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ISSN:1064-8887
1573-9228
DOI:10.1007/s11182-013-9969-8