Structuring effect of heteroepitaxial CdHgTe/CdZnTe systems under irradiation with silver ions

The characteristics of a damaged layer of p -Cd x Hg 1 − x Te/CdZnTe ( x ∼ 0.223) heterostructures after implantation by 100-keV silver ions with the implantation dose Q = 3.0 × 10 13 cm −2 have been obtained using X-ray diffraction, atomic force microscopy, and electron microscopy. It has been foun...

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Bibliographic Details
Published in:Physics of the solid state 2014-11, Vol.56 (11), p.2160-2165
Main Authors: Sizov, F. F., Savkina, R. K., Smirnov, A. B., Udovytska, R. S., Kladko, V. P., Gudymenko, A. I., Safryuk, N. V., Lytvyn, O. S.
Format: Article
Language:English
Subjects:
Analysis
Annealing
Atomic force microscopy
Diffraction
Physics
Physics and Astronomy
Semiconductors
Solid State Physics
X-rays
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Summary:The characteristics of a damaged layer of p -Cd x Hg 1 − x Te/CdZnTe ( x ∼ 0.223) heterostructures after implantation by 100-keV silver ions with the implantation dose Q = 3.0 × 10 13 cm −2 have been obtained using X-ray diffraction, atomic force microscopy, and electron microscopy. It has been found that, as a result of the ion implantation and subsequent annealing (75°C), a uniform array of nanostructures is formed on the surface of Hg(Cd)Te/Zn(Cd)Te samples. The X-ray diffraction patterns of the structurized Hg(Cd)Te/Zn(Cd)Te sample indicate the formation of polycrystalline Hg(Cd)Te phases of cubic structure with a composition x ∼ 0.20 and also oxide Ag 2 O in the subsurface (
ISSN:1063-7834
1090-6460
DOI:10.1134/S1063783414110286