Investigation of the atomic, crystal, and domain structures of materials based on X-ray diffraction and absorption data: A review

Ways to gain and analyze experimental data obtained by X-ray techniques used in material examination are described. Emphasis is on the methods of extended X-ray absorption fine structure, X-ray diffraction, and X-ray low-angle scattering.

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Bibliographic Details
Published in:Technical physics 2015-11, Vol.60 (11), p.1575-1600
Main Authors: Boiko, M. E., Sharkov, M. D., Boiko, A. M., Konnikov, S. G., Bobyl’, A. V., Budkina, N. S.
Format: Article
Language:English
Subjects:
Analysis
Classical and Continuum Physics
Crystals
Diffraction
Investigations
Ionizing radiation
Physics
Physics and Astronomy
Structure
X-rays
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Description
Summary:Ways to gain and analyze experimental data obtained by X-ray techniques used in material examination are described. Emphasis is on the methods of extended X-ray absorption fine structure, X-ray diffraction, and X-ray low-angle scattering.
ISSN:1063-7842
1090-6525
DOI:10.1134/S1063784215110067