Growth and structural and magnetic properties of multilayer Fe, Co, and Cu nanofilms on silicon

The multilayer nanofilms based on ferromagnetic metals (Fe, Co) and a diamagnetic metal (Cu) and deposited onto a Si(001)2 × 1 substrate at a low source temperature are studied by Auger electron spectroscopy, electron-energy loss spectroscopy, low-energy electron diffraction, and the magneto-optical...

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Bibliographic Details
Published in:Technical physics 2015-10, Vol.60 (10), p.1501-1507
Main Authors: Plyusnin, N. I., Il’yashchenko, V. M., Usachev, P. A., Pavlov, V. V.
Format: Article
Language:English
Subjects:
Analysis
Classical and Continuum Physics
Cobalt
Electrons
Ferromagnetism
Magnetic properties
Magnetization
Monomolecular films
Physics
Physics and Astronomy
Physics of Nanostructures
Silicides
Silicon
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Summary:The multilayer nanofilms based on ferromagnetic metals (Fe, Co) and a diamagnetic metal (Cu) and deposited onto a Si(001)2 × 1 substrate at a low source temperature are studied by Auger electron spectroscopy, electron-energy loss spectroscopy, low-energy electron diffraction, and the magneto-optical Kerr effect. It is shown that, depending on growth conditions, the first several metal monolayers form silicides or a solid solution of silicon in the metal with silicon segregated on it. The introduction of two-dimensional (1–4 monolayers) Cu layers and oblique deposition (~45°) result in pseudo-layer-by-layer film growth without silicide formation. The magneto-optical Kerr effect is used to find that the multilayer nanofilms have an easyplane magnetic anisotropy. The influence of the growth conditions and the structure of the films on the magnetization and the coercive field is detected.
ISSN:1063-7842
1090-6525
DOI:10.1134/S1063784215100266