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Characterization of field-emission cathodes based on graphene films on SiC
The properties of a point field-emission cathode representing a structure in the form of a silicon carbide tip coated with a thin graphene film are assessed. For the point cathode with the graphene coating, the current–voltage characteristics are constructed in the Fowler–Nordheim coordinates; the w...
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Published in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2015-09, Vol.49 (9), p.1242-1245 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The properties of a point field-emission cathode representing a structure in the form of a silicon carbide tip coated with a thin graphene film are assessed. For the point cathode with the graphene coating, the current–voltage characteristics are constructed in the Fowler–Nordheim coordinates; the work functions φ of the point cathode are calculated by their slope. The possibility of forming heavily doped
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-SiC on the point surface by the sublimation of low-threshold field emission cathodes with low threshold electric fields and field-emission currents is shown. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782615090146 |