Gas-dynamic fluctuations and noises in the interface of an atmospheric pressure ionization ion source

The paper discusses the mechanisms of origin of ion current noise in a mass spectrometer owing to gas dynamic processes in the interface. It has been shown that the effect can be strong for a so-called ‘short’ interface, where the distance between the sampler outlet, that is, the nozzle or transport...

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Bibliographic Details
Published in:Journal of analytical chemistry (New York, N.Y.) N.Y.), 2011-12, Vol.66 (14), p.1392-1397
Main Authors: Bazhenov, A. N., Bulovich, S. V., Gall’, L. N., Gall’, N. R.
Format: Article
Language:English
Subjects:
Analytical Chemistry
Chemistry
Chemistry and Materials Science
Ionization
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Summary:The paper discusses the mechanisms of origin of ion current noise in a mass spectrometer owing to gas dynamic processes in the interface. It has been shown that the effect can be strong for a so-called ‘short’ interface, where the distance between the sampler outlet, that is, the nozzle or transportation capillary, is of the same size as the Mach barrel length, which would take place if the gas can extend freely. The spectra of gas dynamic noises have been computed in the axially symmetric approach for the above interfaces; the computed noise spectra have been shown to correlate well with those measured for total ion current to the interface skimmer.
ISSN:1061-9348
1608-3199
DOI:10.1134/S1061934811140036