Ultraviolet-C Photoresponsivity Using Fabricated TiO[sub.2] Thin Films and Transimpedance-Amplifier-Based Test Setup

We report on fabricated titanium dioxide (TiO[sub.2]) thin films along with a transimpedance amplifier (TIA) test setup as a photoconductivity detector (sensor) in the ultraviolet-C (UV-C) wavelength region, particularly at 260 nm. TiO[sub.2] thin films deposited on high-resistivity undoped silicon-...

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Bibliographic Details
Published in:Sensors (Basel, Switzerland) Switzerland), 2022-10, Vol.22 (21)
Main Authors: Cadatal-Raduban, Marilou, Pope, Jade, Olejníček, Jiří, Kohout, Michal, Harrison, John A, Hasan, S. M. Rezaul
Format: Article
Language:English
Subjects:
Dielectric films
Infection control
Radiation
Thin films
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Summary:We report on fabricated titanium dioxide (TiO[sub.2]) thin films along with a transimpedance amplifier (TIA) test setup as a photoconductivity detector (sensor) in the ultraviolet-C (UV-C) wavelength region, particularly at 260 nm. TiO[sub.2] thin films deposited on high-resistivity undoped silicon-substrate at thicknesses of 100, 500, and 1000 nm exhibited photoresponsivities of 81.6, 55.6, and 19.6 mA/W, respectively, at 30 V bias voltage. Despite improvements in the crystallinity of the thicker films, the decrease in photocurrent, photoconductivity, photoconductance, and photoresponsivity in thicker films is attributed to an increased number of defects. Varying the thickness of the film can, however, be leveraged to control the wavelength response of the detector. Future development of a chip-based portable UV-C detector using TiO[sub.2] thin films will open new opportunities for a wide range of applications.
ISSN:1424-8220
1424-8220
DOI:10.3390/s22218176