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Expression Profiling of the Slow Rusting Resistance Genes ILr34/I/IYr18/I and ILr67/I/IYr46/I in Common Wheat and Associated miRNAs Patterns
The main efforts in common wheat (Triticum aestivum L.) breeding focus on yield, grain quality, and resistance to biotic and abiotic stresses. One of the major threats affecting global wheat cultivation and causing significant crop production losses are rust diseases, including leaf rust caused by a...
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Published in: | Genes 2023-06, Vol.14 (7) |
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creator | Spychała, Julia Tomkowiak, Agnieszka Noweiska, Aleksandra Bobrowska, Roksana Bocianowski, Jan Ksią żkiewicz, Michał Sobiech, Aleksandra Kwiatek, Michał Tomasz |
description | The main efforts in common wheat (Triticum aestivum L.) breeding focus on yield, grain quality, and resistance to biotic and abiotic stresses. One of the major threats affecting global wheat cultivation and causing significant crop production losses are rust diseases, including leaf rust caused by a biotrophic fungus Puccinia triticina Eriks. Genetically determined resistance to leaf rust has been characterized in young plants (seedling resistance) as well as in plants at the adult plant stage. At the seedling stage, resistance is controlled vertically by major R genes, conferring a race-specific response that is highly effective but usually short-lived due to the rapid evolution of potentially virulent fungi. In mature plants, horizontal adult plant resistance (APR) was described, which provides long-term protection against multiple races of pathogens. A better understanding of molecular mechanisms underlying the function of APR genes would enable the development of new strategies for resistance breeding in wheat. Therefore, in the present study we focused on early transcriptomic responses of two major wheat APR genes, Lr34 and Lr67, and three complementary miRNAs, tae-miR9653b, tae-miR9773 and tae-miR9677b, to inoculation with P. triticina. Plant material consisted of five wheat reference varieties, Artigas, NP846, Glenlea, Lerma Rojo and TX89D6435, containing the Lr34/Yr18 and Lr67/Yr46 resistance genes. Biotic stress was induced by inoculation with fungal spores under controlled conditions in a phytotron. Plant material consisted of leaf tissue sampled before inoculation as well as 6, 12, 24 and 48 h postinoculation (hpi). The APR gene expression was quantified using real-time PCR with two reference genes, whereas miRNA was quantified using droplet digital PCR. This paper describes the resistance response of APR genes to inoculation with races of leaf rust-causing fungi that occur in central Europe. The study revealed high variability of expression profiles between varieties and time-points, with the prevalence of downregulation for APR genes and upregulation for miRNAs during the development of an early defense response. Nevertheless, despite the downregulation initially observed, the expression of Lr34 and Lr67 genes in studied cultivars was significantly higher than in a control line carrying wild (susceptible) alleles. |
doi_str_mv | 10.3390/genes14071376 |
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One of the major threats affecting global wheat cultivation and causing significant crop production losses are rust diseases, including leaf rust caused by a biotrophic fungus Puccinia triticina Eriks. Genetically determined resistance to leaf rust has been characterized in young plants (seedling resistance) as well as in plants at the adult plant stage. At the seedling stage, resistance is controlled vertically by major R genes, conferring a race-specific response that is highly effective but usually short-lived due to the rapid evolution of potentially virulent fungi. In mature plants, horizontal adult plant resistance (APR) was described, which provides long-term protection against multiple races of pathogens. A better understanding of molecular mechanisms underlying the function of APR genes would enable the development of new strategies for resistance breeding in wheat. Therefore, in the present study we focused on early transcriptomic responses of two major wheat APR genes, Lr34 and Lr67, and three complementary miRNAs, tae-miR9653b, tae-miR9773 and tae-miR9677b, to inoculation with P. triticina. Plant material consisted of five wheat reference varieties, Artigas, NP846, Glenlea, Lerma Rojo and TX89D6435, containing the Lr34/Yr18 and Lr67/Yr46 resistance genes. Biotic stress was induced by inoculation with fungal spores under controlled conditions in a phytotron. Plant material consisted of leaf tissue sampled before inoculation as well as 6, 12, 24 and 48 h postinoculation (hpi). The APR gene expression was quantified using real-time PCR with two reference genes, whereas miRNA was quantified using droplet digital PCR. This paper describes the resistance response of APR genes to inoculation with races of leaf rust-causing fungi that occur in central Europe. The study revealed high variability of expression profiles between varieties and time-points, with the prevalence of downregulation for APR genes and upregulation for miRNAs during the development of an early defense response. Nevertheless, despite the downregulation initially observed, the expression of Lr34 and Lr67 genes in studied cultivars was significantly higher than in a control line carrying wild (susceptible) alleles.</description><identifier>ISSN: 2073-4425</identifier><identifier>EISSN: 2073-4425</identifier><identifier>DOI: 10.3390/genes14071376</identifier><language>eng</language><publisher>MDPI AG</publisher><subject>Fungi ; Gene expression ; Genes ; Genetic research ; Instrument industry ; MicroRNA ; Scientific equipment and supplies industry ; Wheat</subject><ispartof>Genes, 2023-06, Vol.14 (7)</ispartof><rights>COPYRIGHT 2023 MDPI AG</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Spychała, Julia</creatorcontrib><creatorcontrib>Tomkowiak, Agnieszka</creatorcontrib><creatorcontrib>Noweiska, Aleksandra</creatorcontrib><creatorcontrib>Bobrowska, Roksana</creatorcontrib><creatorcontrib>Bocianowski, Jan</creatorcontrib><creatorcontrib>Ksi&#261;żkiewicz, Michał</creatorcontrib><creatorcontrib>Sobiech, Aleksandra</creatorcontrib><creatorcontrib>Kwiatek, Michał Tomasz</creatorcontrib><title>Expression Profiling of the Slow Rusting Resistance Genes ILr34/I/IYr18/I and ILr67/I/IYr46/I in Common Wheat and Associated miRNAs Patterns</title><title>Genes</title><description>The main efforts in common wheat (Triticum aestivum L.) breeding focus on yield, grain quality, and resistance to biotic and abiotic stresses. One of the major threats affecting global wheat cultivation and causing significant crop production losses are rust diseases, including leaf rust caused by a biotrophic fungus Puccinia triticina Eriks. Genetically determined resistance to leaf rust has been characterized in young plants (seedling resistance) as well as in plants at the adult plant stage. At the seedling stage, resistance is controlled vertically by major R genes, conferring a race-specific response that is highly effective but usually short-lived due to the rapid evolution of potentially virulent fungi. In mature plants, horizontal adult plant resistance (APR) was described, which provides long-term protection against multiple races of pathogens. A better understanding of molecular mechanisms underlying the function of APR genes would enable the development of new strategies for resistance breeding in wheat. Therefore, in the present study we focused on early transcriptomic responses of two major wheat APR genes, Lr34 and Lr67, and three complementary miRNAs, tae-miR9653b, tae-miR9773 and tae-miR9677b, to inoculation with P. triticina. Plant material consisted of five wheat reference varieties, Artigas, NP846, Glenlea, Lerma Rojo and TX89D6435, containing the Lr34/Yr18 and Lr67/Yr46 resistance genes. Biotic stress was induced by inoculation with fungal spores under controlled conditions in a phytotron. Plant material consisted of leaf tissue sampled before inoculation as well as 6, 12, 24 and 48 h postinoculation (hpi). The APR gene expression was quantified using real-time PCR with two reference genes, whereas miRNA was quantified using droplet digital PCR. This paper describes the resistance response of APR genes to inoculation with races of leaf rust-causing fungi that occur in central Europe. The study revealed high variability of expression profiles between varieties and time-points, with the prevalence of downregulation for APR genes and upregulation for miRNAs during the development of an early defense response. Nevertheless, despite the downregulation initially observed, the expression of Lr34 and Lr67 genes in studied cultivars was significantly higher than in a control line carrying wild (susceptible) alleles.</description><subject>Fungi</subject><subject>Gene expression</subject><subject>Genes</subject><subject>Genetic research</subject><subject>Instrument industry</subject><subject>MicroRNA</subject><subject>Scientific equipment and supplies industry</subject><subject>Wheat</subject><issn>2073-4425</issn><issn>2073-4425</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNptkE9Lw0AQxYMoWGqP3hc8p9n_mxxDqTVQtNSCeCqb3Um6kmwkG9EP4Yc2tR56cOYww483b-BF0S3Bc8YynNTgIRCOFWFKXkQTihWLOafi8my_jmYhvOGxOKYYi0n0vfx67yEE13m06bvKNc7XqKvQcAD03HSfaPsRhiPbQnBh0N4AWh1_oWLdM54USfHakzQpkPb2yKQ6MS5H5jxadG07mr8cQA-_mjyEzjg9gEWt2z7mAW30MEDvw010VekmwOxvTqPd_XK3eIjXT6tika_jWioaC1GqFBQQnJZUlqmqpKTGAhGZxZktudK4EpgYzLUhwlJREQOClJxxC1iyaXR3sq11A3vnq27otWldMPtciYyM8TA6qub_qMa20DrTeRizgvODH3TZcw4</recordid><startdate>20230601</startdate><enddate>20230601</enddate><creator>Spychała, Julia</creator><creator>Tomkowiak, Agnieszka</creator><creator>Noweiska, Aleksandra</creator><creator>Bobrowska, Roksana</creator><creator>Bocianowski, Jan</creator><creator>Ksi&#261;żkiewicz, Michał</creator><creator>Sobiech, Aleksandra</creator><creator>Kwiatek, Michał Tomasz</creator><general>MDPI AG</general><scope/></search><sort><creationdate>20230601</creationdate><title>Expression Profiling of the Slow Rusting Resistance Genes ILr34/I/IYr18/I and ILr67/I/IYr46/I in Common Wheat and Associated miRNAs Patterns</title><author>Spychała, Julia ; Tomkowiak, Agnieszka ; Noweiska, Aleksandra ; Bobrowska, Roksana ; Bocianowski, Jan ; Ksi&#261;żkiewicz, Michał ; Sobiech, Aleksandra ; Kwiatek, Michał Tomasz</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-g672-55b78e7e108b26b87f662cde159d09db47a0f501c04ac15d25f1ce51b434de063</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Fungi</topic><topic>Gene expression</topic><topic>Genes</topic><topic>Genetic research</topic><topic>Instrument industry</topic><topic>MicroRNA</topic><topic>Scientific equipment and supplies industry</topic><topic>Wheat</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Spychała, Julia</creatorcontrib><creatorcontrib>Tomkowiak, Agnieszka</creatorcontrib><creatorcontrib>Noweiska, Aleksandra</creatorcontrib><creatorcontrib>Bobrowska, Roksana</creatorcontrib><creatorcontrib>Bocianowski, Jan</creatorcontrib><creatorcontrib>Ksi&#261;żkiewicz, Michał</creatorcontrib><creatorcontrib>Sobiech, Aleksandra</creatorcontrib><creatorcontrib>Kwiatek, Michał Tomasz</creatorcontrib><jtitle>Genes</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Spychała, Julia</au><au>Tomkowiak, Agnieszka</au><au>Noweiska, Aleksandra</au><au>Bobrowska, Roksana</au><au>Bocianowski, Jan</au><au>Ksi&#261;żkiewicz, Michał</au><au>Sobiech, Aleksandra</au><au>Kwiatek, Michał Tomasz</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Expression Profiling of the Slow Rusting Resistance Genes ILr34/I/IYr18/I and ILr67/I/IYr46/I in Common Wheat and Associated miRNAs Patterns</atitle><jtitle>Genes</jtitle><date>2023-06-01</date><risdate>2023</risdate><volume>14</volume><issue>7</issue><issn>2073-4425</issn><eissn>2073-4425</eissn><abstract>The main efforts in common wheat (Triticum aestivum L.) breeding focus on yield, grain quality, and resistance to biotic and abiotic stresses. One of the major threats affecting global wheat cultivation and causing significant crop production losses are rust diseases, including leaf rust caused by a biotrophic fungus Puccinia triticina Eriks. Genetically determined resistance to leaf rust has been characterized in young plants (seedling resistance) as well as in plants at the adult plant stage. At the seedling stage, resistance is controlled vertically by major R genes, conferring a race-specific response that is highly effective but usually short-lived due to the rapid evolution of potentially virulent fungi. In mature plants, horizontal adult plant resistance (APR) was described, which provides long-term protection against multiple races of pathogens. A better understanding of molecular mechanisms underlying the function of APR genes would enable the development of new strategies for resistance breeding in wheat. Therefore, in the present study we focused on early transcriptomic responses of two major wheat APR genes, Lr34 and Lr67, and three complementary miRNAs, tae-miR9653b, tae-miR9773 and tae-miR9677b, to inoculation with P. triticina. Plant material consisted of five wheat reference varieties, Artigas, NP846, Glenlea, Lerma Rojo and TX89D6435, containing the Lr34/Yr18 and Lr67/Yr46 resistance genes. Biotic stress was induced by inoculation with fungal spores under controlled conditions in a phytotron. Plant material consisted of leaf tissue sampled before inoculation as well as 6, 12, 24 and 48 h postinoculation (hpi). The APR gene expression was quantified using real-time PCR with two reference genes, whereas miRNA was quantified using droplet digital PCR. This paper describes the resistance response of APR genes to inoculation with races of leaf rust-causing fungi that occur in central Europe. The study revealed high variability of expression profiles between varieties and time-points, with the prevalence of downregulation for APR genes and upregulation for miRNAs during the development of an early defense response. Nevertheless, despite the downregulation initially observed, the expression of Lr34 and Lr67 genes in studied cultivars was significantly higher than in a control line carrying wild (susceptible) alleles.</abstract><pub>MDPI AG</pub><doi>10.3390/genes14071376</doi></addata></record> |
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title | Expression Profiling of the Slow Rusting Resistance Genes ILr34/I/IYr18/I and ILr67/I/IYr46/I in Common Wheat and Associated miRNAs Patterns |
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