TEM characterisation of helium platelets in implanted uranium dioxide

Polycrystalline UO2 discs were implanted with 500 keV helium ions at different temperatures (200, 400 and 600 °C) and fluences (1 and 3 × 1016 at cm−2), and further characterised by transmission electron microscopy (TEM). Examinations performed on the more concentrated sample implanted at 600 °C all...

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Bibliographic Details
Published in:Journal of nuclear materials 2020-01, Vol.528, p.151832, Article 151832
Main Authors: Michel, Adrien V., Carlot, Gaëlle, Onofri, Claire, Sabathier, Catherine, Cabié, Martiane, Dumont, Myriam
Format: Article
Language:English
Subjects:
Helium
Helium implantation
Helium ions
Nuclear Experiment
Nuclear Theory
Physics
Platelets
Transmission electron microscopy
Uranium
Uranium dioxide
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Summary:Polycrystalline UO2 discs were implanted with 500 keV helium ions at different temperatures (200, 400 and 600 °C) and fluences (1 and 3 × 1016 at cm−2), and further characterised by transmission electron microscopy (TEM). Examinations performed on the more concentrated sample implanted at 600 °C allowed us to observe platelets for the first time in the UO2 material in planes parallel to {111}UO2. A complete study was undertaken in grains oriented along , and directions to determine {1 1 1} variant equivalence on platelet formation. Their features like density and size have been characterised with an appropriate statistic. •Helium platelets have been observed by TEM for the first time in uranium dioxide.•Platelets form from 600 °C and from 0.95 at. % of helium.•Platelet distribution in {1 1 1} habit planes depends on UO2 crystallographic orientation.•High helium concentration and high internal pressure are contained in platelets.
ISSN:0022-3115
1873-4820
DOI:10.1016/j.jnucmat.2019.151832