Accumulation layers in cryogenic electrolytes

• Published in: Low temperature physics (Woodbury, N.Y.) N.Y.), 2020-11, Vol.46 (11), p.1108-1113
• Main Authors: Chikina, I., Shikin, V.
• Format: Article
• Language: English
• Subjects: Accumulation; Chemical Sciences; Electrolytes; Electrolytic cells; Material chemistry; Self-similarity
• ISSN: 1063-777X; 1090-6517
• DOI: 10.1063/10.0002154

Flat cryogenic cells with a radiation source at one of the control (zero) electrodes create promising opportunities for studying the properties of charged accumulation layers in weakly conducting media. The question as to the origin of different relaxation times, short τ 0 or long τ ∞ ≫ τ 0, when the medium is exposed to a rectangular surge of the control voltage V g, remains relevant in this area. The existing, primarily numerical, analysis of the problem confirms that there is a hierarchy of relaxation times, but ignores the physical nature of the observed dispersion. A “self-similar” version of the accumulation layer’s adjustment to its stationary state is discussed. This scenario yields clear definitions of τ 0 and τ ∞ ≫ τ 0. A relationship between τ ∞ and V g is found. The pioneering significance that cryogenic data has in the experimental study of accumulation layer kinetics is noted.