A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation

This work presents the performance degradation of a 32-bit DSP fabricated with 28 nm FDSOI technology subjected to different levels of gamma radiation. A new mixed hardening methodology based on electrical compensation and thermal regeneration is applied to the irradiated devices to recover the degr...

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Bibliographic Details
Published in:Microelectronics and reliability 2021-11, Vol.126, p.114397, Article 114397
Main Authors: Acuña, A. Ureña, Armani, J.M., Slimani, M., Miro-Panades, I., Dollfus, P.
Format: Article
Language:English
Subjects:
Electric compensation
Electronics
Engineering Sciences
FDSOI
Hardening reliability
Instrumentation and Detectors
Nuclear Experiment
Physics
Thermal regeneration
TID
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Summary:This work presents the performance degradation of a 32-bit DSP fabricated with 28 nm FDSOI technology subjected to different levels of gamma radiation. A new mixed hardening methodology based on electrical compensation and thermal regeneration is applied to the irradiated devices to recover the degraded electrical characteristics induced by the total ionizing dose. The application of this new methodology seeks to extend the lifetime of FDSOI integrated circuits under high radiation conditions while keeping good reliability. •Radiation effects of FDSOI DSP•Thermal regeneration of the degraded performances•Electrical compensation of the degraded performances•Mixed hardening methodology including thermal regeneration and electrical compensation
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2021.114397