Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

Synopsis We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the B...

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Bibliographic Details
Published in:Journal of physics. Conference series 2020-01, Vol.1412 (20), p.202028
Main Authors: Niozu, A, Kumagai, Y, Nishiyama, T, Fukuzawa, H, Motomura, K, Bucher, M, Ito, Y, Takanashi, T, Asa, K, Sato, Y, You, D, Li, Y, Ono, T, Kukk, E, Miron, C, Neagu, L, Callegari, C, Fraia, M Di, Rossi, G, Galli, D E, Pincelli, T, Colombo, A, Kameshima, T, Joti, Y, Hatsui, T, Owada, S, Katayama, T, Togashi, T, Tono, K, Yabashi, M, Matsuda, K, Bostedt, C, Nagaya, K, Ueda, K
Format: Article
Language:English
Subjects:
Angular correlation
Crystal defects
Diffraction patterns
Free electron lasers
Nanoparticles
Physics
Stacking faults
Twinning
X-ray scattering
X-rays
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Summary:Synopsis We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1412/20/202028