Accurate measurement of the cutoff wavelength in a microstructured optical fiber by means of an azimuthal filtering technique

A simple self-referenced nondestructive method is proposed for measuring the cutoff wavelength of microstructured optical fibers (MOFs). It is based on the analysis of the time-dependent optical power transmitted through a bow-tie slit rotating in the far-field pattern of the fiber under test. As a...

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Bibliographic Details
Published in:Optics letters 2006-06, Vol.31 (12), p.1779-1781
Main Authors: LABONTE, Laurent, PAGNOUX, Dominique, ROY, Philippe, BAHLOUL, Faouzi, ZGHAL, Mourad, MELIN, Gilles, BUROV, Ekaterina, RENVERSEZ, Gilles
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Integrated optics. Optical fibers and wave guides
Optical and optoelectronic circuits
Optical materials
Optics
Photonic bandgap materials
Physics
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Summary:A simple self-referenced nondestructive method is proposed for measuring the cutoff wavelength of microstructured optical fibers (MOFs). It is based on the analysis of the time-dependent optical power transmitted through a bow-tie slit rotating in the far-field pattern of the fiber under test. As a first demonstration, the cutoff wavelength of a 2 m MOF sample is found to be close to that provided by numerical predictions (approximately 25 nm higher). Because of the high dynamics of the measurement, the uncertainty is limited to Dlambda= +/-10 nm.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.31.001779