Validation of radiation hardened designs by pulsed laser testing and SPICE analysis

A new pulsed laser system dedicated to the simulation of radiation effects on integrated circuits is presented. On-line testing capabilities are detailed and two SPICE models of radiation induced transient currents are proposed to be used for results analysis.

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Bibliographic Details
Published in:Microelectronics and reliability 1999, Vol.39 (6), p.931-935
Main Authors: Pouget, V., Lewis, D., Lapuyade, H., Briand, R., Fouillat, P., Sarger, L., Calvet, M.-C.
Format: Article
Language:English
Subjects:
Engineering Sciences
Micro and nanotechnologies
Microelectronics
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Description
Summary:A new pulsed laser system dedicated to the simulation of radiation effects on integrated circuits is presented. On-line testing capabilities are detailed and two SPICE models of radiation induced transient currents are proposed to be used for results analysis.
ISSN:0026-2714
1872-941X
DOI:10.1016/S0026-2714(99)00125-0