Nanometric deformations of thin niobium layers under a strong electric field using soft X-ray laser interferometry

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Bibliographic Details
Published in:Journal of applied physics 2005 (98)
Main Authors: Jamelot, Gérard, Ros, David, Carillon, A., Koslova, M., Mocek, T., Rus, B., Prag, A.R, Joyeux, D., Phalippou, D., Boussoukaya, M., Kalmykow, M., Ballester, F., Jacques, E.
Format: Article
Language:English
Subjects:
Instrumentation and Detectors
Optics
Physics
Plasma Physics
Online Access:Get full text
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ISSN:0021-8979
1089-7550