Loading…

Electrical degradation of porous and dense LSM/YSZ interface

Electrochemical cells formed by the interface between dense and porous lanthanum strontium manganate (LSM) and yttria stabilized zirconia (YSZ) were submitted to annealing temperatures varying from 1373 K to 1673 K for 200 h and studied by Impedance Spectroscopy (IS) in order to investigate how the...

Full description

Saved in:
Bibliographic Details
Published in:Solid state ionics 2006-03, Vol.177 (9), p.915-921
Main Authors: Brant, M.C., Matencio, T., Dessemond, L., Domingues, R.Z.
Format: Article
Language:English
Subjects:
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c362t-7060796f0492226574a108b963e0a74f122a66afab523f1654484025e8393f0a3
cites
container_end_page 921
container_issue 9
container_start_page 915
container_title Solid state ionics
container_volume 177
creator Brant, M.C.
Matencio, T.
Dessemond, L.
Domingues, R.Z.
description Electrochemical cells formed by the interface between dense and porous lanthanum strontium manganate (LSM) and yttria stabilized zirconia (YSZ) were submitted to annealing temperatures varying from 1373 K to 1673 K for 200 h and studied by Impedance Spectroscopy (IS) in order to investigate how the high annealing temperature can modify the contact between LSM/YSZ and to which extension these changes influence the electrical behavior of dense and porous LSM electrodes before and after the formation of insulating phases. Up to 1473 K the annealing process did not lead to substantial electrical behavior modifications at the LSM/YSZ interfaces for both porous and dense electrodes. IS measurements show two capacitive semicircles, the best fitting of impedance data brings to an equivalent circuit constituted by a serial combination of the electrolyte resistance and two parallel combinations of a resistance and a constant phase element, CPE. The higher frequency semicircles, HF, were attributed to the diffusion of oxide ions from the interface LSM/YSZ to the oxide ion vacancies located at the electrolyte surface. The semicircle at lower frequency, LF, will be ascribed to the oxygen species adsorption and diffusion in the LSM. At 1473 K the only changes recorded are related with the sinterization process of the porous electrodes. Over of 1473 K, the resistance contributions increased largely, especially for porous electrodes, and one additional semicircle was observed. This semicircle was associated to the oxygen diffusion process at the new insulating phases formed from YSZ and LSM solid state reactions. Porous and dense electrodes exhibited different rates for the degradation process. The porous electrode degraded faster than the dense one, probably because of the morphological effects as grain growth and their coalescence during annealing at higher temperatures.
doi_str_mv 10.1016/j.ssi.2006.02.012
format article
fullrecord <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_00333709v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0167273806000993</els_id><sourcerecordid>29317532</sourcerecordid><originalsourceid>FETCH-LOGICAL-c362t-7060796f0492226574a108b963e0a74f122a66afab523f1654484025e8393f0a3</originalsourceid><addsrcrecordid>eNp9kEFLwzAUx4MoOKcfwFtPgod2L0mbtOhlyHRCxcP0oJeQpS-a0bUz6QZ-ezMmHj09eO_3_8P7EXJJIaNAxWSVheAyBiAyYBlQdkRGtJQslaKsjskoMjJlkpen5CyEFUSQl2JEbmctmsE7o9ukwQ-vGz24vkt6m2x6329DorsmXrqASb14mrwt3hPXDeitNnhOTqxuA178zjF5vZ-93M3T-vnh8W5ap4YLNqQSBMhKWMgrxpgoZK4plMtKcAQtc0sZ00Joq5cF45aKIs_LHFiBJa-4Bc3H5PrQ-6lbtfFurf236rVT82mt9jsAzrmEakcje3VgN77_2mIY1NoFg22rO4zvKFZxKgvOIkgPoPF9CB7tXzMFtXeqVio6VXunCpiKTmPm5pDB-O3OoVfBOOwMNs5Hjarp3T_pH0R3e2U</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29317532</pqid></control><display><type>article</type><title>Electrical degradation of porous and dense LSM/YSZ interface</title><source>Elsevier</source><creator>Brant, M.C. ; Matencio, T. ; Dessemond, L. ; Domingues, R.Z.</creator><creatorcontrib>Brant, M.C. ; Matencio, T. ; Dessemond, L. ; Domingues, R.Z.</creatorcontrib><description>Electrochemical cells formed by the interface between dense and porous lanthanum strontium manganate (LSM) and yttria stabilized zirconia (YSZ) were submitted to annealing temperatures varying from 1373 K to 1673 K for 200 h and studied by Impedance Spectroscopy (IS) in order to investigate how the high annealing temperature can modify the contact between LSM/YSZ and to which extension these changes influence the electrical behavior of dense and porous LSM electrodes before and after the formation of insulating phases. Up to 1473 K the annealing process did not lead to substantial electrical behavior modifications at the LSM/YSZ interfaces for both porous and dense electrodes. IS measurements show two capacitive semicircles, the best fitting of impedance data brings to an equivalent circuit constituted by a serial combination of the electrolyte resistance and two parallel combinations of a resistance and a constant phase element, CPE. The higher frequency semicircles, HF, were attributed to the diffusion of oxide ions from the interface LSM/YSZ to the oxide ion vacancies located at the electrolyte surface. The semicircle at lower frequency, LF, will be ascribed to the oxygen species adsorption and diffusion in the LSM. At 1473 K the only changes recorded are related with the sinterization process of the porous electrodes. Over of 1473 K, the resistance contributions increased largely, especially for porous electrodes, and one additional semicircle was observed. This semicircle was associated to the oxygen diffusion process at the new insulating phases formed from YSZ and LSM solid state reactions. Porous and dense electrodes exhibited different rates for the degradation process. The porous electrode degraded faster than the dense one, probably because of the morphological effects as grain growth and their coalescence during annealing at higher temperatures.</description><identifier>ISSN: 0167-2738</identifier><identifier>EISSN: 1872-7689</identifier><identifier>DOI: 10.1016/j.ssi.2006.02.012</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Cathode ; Chemical Sciences ; Degradation ; Impedance ; Interface reaction ; LSM ; Material chemistry ; Solid oxide fuel cell</subject><ispartof>Solid state ionics, 2006-03, Vol.177 (9), p.915-921</ispartof><rights>2006 Elsevier B.V.</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c362t-7060796f0492226574a108b963e0a74f122a66afab523f1654484025e8393f0a3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://hal.science/hal-00333709$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Brant, M.C.</creatorcontrib><creatorcontrib>Matencio, T.</creatorcontrib><creatorcontrib>Dessemond, L.</creatorcontrib><creatorcontrib>Domingues, R.Z.</creatorcontrib><title>Electrical degradation of porous and dense LSM/YSZ interface</title><title>Solid state ionics</title><description>Electrochemical cells formed by the interface between dense and porous lanthanum strontium manganate (LSM) and yttria stabilized zirconia (YSZ) were submitted to annealing temperatures varying from 1373 K to 1673 K for 200 h and studied by Impedance Spectroscopy (IS) in order to investigate how the high annealing temperature can modify the contact between LSM/YSZ and to which extension these changes influence the electrical behavior of dense and porous LSM electrodes before and after the formation of insulating phases. Up to 1473 K the annealing process did not lead to substantial electrical behavior modifications at the LSM/YSZ interfaces for both porous and dense electrodes. IS measurements show two capacitive semicircles, the best fitting of impedance data brings to an equivalent circuit constituted by a serial combination of the electrolyte resistance and two parallel combinations of a resistance and a constant phase element, CPE. The higher frequency semicircles, HF, were attributed to the diffusion of oxide ions from the interface LSM/YSZ to the oxide ion vacancies located at the electrolyte surface. The semicircle at lower frequency, LF, will be ascribed to the oxygen species adsorption and diffusion in the LSM. At 1473 K the only changes recorded are related with the sinterization process of the porous electrodes. Over of 1473 K, the resistance contributions increased largely, especially for porous electrodes, and one additional semicircle was observed. This semicircle was associated to the oxygen diffusion process at the new insulating phases formed from YSZ and LSM solid state reactions. Porous and dense electrodes exhibited different rates for the degradation process. The porous electrode degraded faster than the dense one, probably because of the morphological effects as grain growth and their coalescence during annealing at higher temperatures.</description><subject>Cathode</subject><subject>Chemical Sciences</subject><subject>Degradation</subject><subject>Impedance</subject><subject>Interface reaction</subject><subject>LSM</subject><subject>Material chemistry</subject><subject>Solid oxide fuel cell</subject><issn>0167-2738</issn><issn>1872-7689</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNp9kEFLwzAUx4MoOKcfwFtPgod2L0mbtOhlyHRCxcP0oJeQpS-a0bUz6QZ-ezMmHj09eO_3_8P7EXJJIaNAxWSVheAyBiAyYBlQdkRGtJQslaKsjskoMjJlkpen5CyEFUSQl2JEbmctmsE7o9ukwQ-vGz24vkt6m2x6329DorsmXrqASb14mrwt3hPXDeitNnhOTqxuA178zjF5vZ-93M3T-vnh8W5ap4YLNqQSBMhKWMgrxpgoZK4plMtKcAQtc0sZ00Joq5cF45aKIs_LHFiBJa-4Bc3H5PrQ-6lbtfFurf236rVT82mt9jsAzrmEakcje3VgN77_2mIY1NoFg22rO4zvKFZxKgvOIkgPoPF9CB7tXzMFtXeqVio6VXunCpiKTmPm5pDB-O3OoVfBOOwMNs5Hjarp3T_pH0R3e2U</recordid><startdate>20060331</startdate><enddate>20060331</enddate><creator>Brant, M.C.</creator><creator>Matencio, T.</creator><creator>Dessemond, L.</creator><creator>Domingues, R.Z.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>1XC</scope></search><sort><creationdate>20060331</creationdate><title>Electrical degradation of porous and dense LSM/YSZ interface</title><author>Brant, M.C. ; Matencio, T. ; Dessemond, L. ; Domingues, R.Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c362t-7060796f0492226574a108b963e0a74f122a66afab523f1654484025e8393f0a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Cathode</topic><topic>Chemical Sciences</topic><topic>Degradation</topic><topic>Impedance</topic><topic>Interface reaction</topic><topic>LSM</topic><topic>Material chemistry</topic><topic>Solid oxide fuel cell</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Brant, M.C.</creatorcontrib><creatorcontrib>Matencio, T.</creatorcontrib><creatorcontrib>Dessemond, L.</creatorcontrib><creatorcontrib>Domingues, R.Z.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Solid state ionics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Brant, M.C.</au><au>Matencio, T.</au><au>Dessemond, L.</au><au>Domingues, R.Z.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrical degradation of porous and dense LSM/YSZ interface</atitle><jtitle>Solid state ionics</jtitle><date>2006-03-31</date><risdate>2006</risdate><volume>177</volume><issue>9</issue><spage>915</spage><epage>921</epage><pages>915-921</pages><issn>0167-2738</issn><eissn>1872-7689</eissn><abstract>Electrochemical cells formed by the interface between dense and porous lanthanum strontium manganate (LSM) and yttria stabilized zirconia (YSZ) were submitted to annealing temperatures varying from 1373 K to 1673 K for 200 h and studied by Impedance Spectroscopy (IS) in order to investigate how the high annealing temperature can modify the contact between LSM/YSZ and to which extension these changes influence the electrical behavior of dense and porous LSM electrodes before and after the formation of insulating phases. Up to 1473 K the annealing process did not lead to substantial electrical behavior modifications at the LSM/YSZ interfaces for both porous and dense electrodes. IS measurements show two capacitive semicircles, the best fitting of impedance data brings to an equivalent circuit constituted by a serial combination of the electrolyte resistance and two parallel combinations of a resistance and a constant phase element, CPE. The higher frequency semicircles, HF, were attributed to the diffusion of oxide ions from the interface LSM/YSZ to the oxide ion vacancies located at the electrolyte surface. The semicircle at lower frequency, LF, will be ascribed to the oxygen species adsorption and diffusion in the LSM. At 1473 K the only changes recorded are related with the sinterization process of the porous electrodes. Over of 1473 K, the resistance contributions increased largely, especially for porous electrodes, and one additional semicircle was observed. This semicircle was associated to the oxygen diffusion process at the new insulating phases formed from YSZ and LSM solid state reactions. Porous and dense electrodes exhibited different rates for the degradation process. The porous electrode degraded faster than the dense one, probably because of the morphological effects as grain growth and their coalescence during annealing at higher temperatures.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.ssi.2006.02.012</doi><tpages>7</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0167-2738
ispartof Solid state ionics, 2006-03, Vol.177 (9), p.915-921
issn 0167-2738
1872-7689
language eng
recordid cdi_hal_primary_oai_HAL_hal_00333709v1
source Elsevier
subjects Cathode
Chemical Sciences
Degradation
Impedance
Interface reaction
LSM
Material chemistry
Solid oxide fuel cell
title Electrical degradation of porous and dense LSM/YSZ interface
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T00%3A01%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electrical%20degradation%20of%20porous%20and%20dense%20LSM/YSZ%20interface&rft.jtitle=Solid%20state%20ionics&rft.au=Brant,%20M.C.&rft.date=2006-03-31&rft.volume=177&rft.issue=9&rft.spage=915&rft.epage=921&rft.pages=915-921&rft.issn=0167-2738&rft.eissn=1872-7689&rft_id=info:doi/10.1016/j.ssi.2006.02.012&rft_dat=%3Cproquest_hal_p%3E29317532%3C/proquest_hal_p%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c362t-7060796f0492226574a108b963e0a74f122a66afab523f1654484025e8393f0a3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=29317532&rft_id=info:pmid/&rfr_iscdi=true