Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications

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Bibliographic Details
Published in:Microelectronics and reliability 2008 (48), p.1202-1207
Main Authors: Bourqui, M.L., Bechou, L., Gilard, O., Deshayes, Y., del Vecchio, P., How, L.S., Rosala, F., Ousten, Y., Touboul, A.
Format: Article
Language:English
Subjects:
Electronics
Engineering Sciences
Online Access:Get full text
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ISSN:0026-2714
1872-941X