Sequential environmental stresses tests qualification for automotive components

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Bibliographic Details
Published in:Microelectronics and reliability 2007, Vol.47 (9-nov)
Main Authors: Bahi, M.A., Lecuyer, P., Fremont, H., Landesman, J.P.
Format: Article
Language:English
Subjects:
Condensed Matter
Materials Science
Physics
Online Access:Get full text
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ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2007.07.004