Automatic alignment of a Kirkpatrick-Baez active optic by use of a soft-x-ray Hartmann wavefront sensor

• Published in: Optics letters 2006-01, Vol.31 (2), p.199-201
• Main Authors: MERCERE, Pascal, IDIR, Mourad, MORENO, Thierry, CAUCHON, Gilles, DOVILLAIRE, Guillaume, LEVECQ, Xavier, COUVET, Laurent, BUCOURT, Samuel, ZEITOUN, Philippe
• Format: Article
• Language: English
• Subjects: Electromagnetism; electron and ion optics; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Optical testing techniques; Optics; Physics; X- and γ-ray instruments and techniques; X- and γ-ray sources, mirrors, gratings and detectors; X-ray beams and x-ray optics
• ISSN: 0146-9592; 1539-4794
• DOI: 10.1364/ol.31.000199

We present what we believe to be the first automatic alignment of a synchrotron beamline by the Hartmann technique. Experiments were performed, in the soft-x-ray range (E=3 keV, lambda=0.414 nm), by using a four-actuator Kirkpatrick-Baez (KB) active optic. A system imaging the KB focal spot and a soft-x-ray Hartmann wavefront sensor were used alternatively to control the KB optic. The beam corrected with the help of the imaging system was used to calibrate the wavefront sensor. With both closed loops, we focused the beam into a 6.8 microm x 9 microm FWHM focal spot.