Imaging and quality assessment of high-harmonic focal spots

We present a direct method of studying the focusability of an intense, short-pulse extreme-ultraviolet (XUV) beam obtained by high-harmonic generation. We perform near-field imaging of the focal spot of five high-harmonic orders strongly focused by a broadband toroidal mirror. To visualize the focal...

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Bibliographic Details
Published in:Optics letters 2003-06, Vol.28 (12), p.1049-1051
Main Authors: Valentin, C, Douillet, D, Kazamias, S, Lefrou, Th, Grillon, G, Augé, F, Mullot, G, Balcou, Ph, Mercère, P, Zeitoun, Ph
Format: Article
Language:English
Subjects:
Optics
Physics
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Summary:We present a direct method of studying the focusability of an intense, short-pulse extreme-ultraviolet (XUV) beam obtained by high-harmonic generation. We perform near-field imaging of the focal spot of five high-harmonic orders strongly focused by a broadband toroidal mirror. To visualize the focal spot directly, we image the fluorescence induced by an XUV beam on a cerium-doped YAG crystal on a visible CCD camera. We can thus measure the harmonic spot size on a single image, together with the Strehl ratio, to evaluate the quality of focusing. Such techniques should become instrumental in optimizing the focusing conditions and reaching intensities required for exploring attosecond nonlinear optics in the XUV range.
ISSN:0146-9592
1539-4794
DOI:10.1364/ol.28.001049