Experimental verification of negative refraction for a wedge-type negative index metamaterial operating at terahertz

We report on angle-resolved time domain spectroscopy (TDS) carried out on a prismlike negative index metamaterial operating around 0.5 THz. The wedge-type devices are constituted of hole arrays etched in gold thin films, which are stacked according to a sequential mask shift. By means of a goniometr...

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Published in:Applied physics letters 2010-11, Vol.97 (18), p.181902-181902-3
Main Authors: Wang, Shengxiang, Garet, Frédéric, Blary, Karine, Lheurette, Eric, Coutaz, Jean Louis, Lippens, Didier
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Engineering Sciences
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description We report on angle-resolved time domain spectroscopy (TDS) carried out on a prismlike negative index metamaterial operating around 0.5 THz. The wedge-type devices are constituted of hole arrays etched in gold thin films, which are stacked according to a sequential mask shift. By means of a goniometric TDS setup and subsequent analysis of the temporal waveforms, negative refraction is demonstrated with values close to n = − 1 around 0.5 THz. The dispersion of refractive index retrieved from the Snell-Descartes law shows comparable trends in comparison with the dispersion deduced from complex transmission and reflection measurements on slab-type samples.
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title Experimental verification of negative refraction for a wedge-type negative index metamaterial operating at terahertz
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