Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation

The More than Moore axis of development in microelectronic technologies is generating increasingly complex assembly techniques. It has therefore become very hard to localize a current leakage inside such structures. One very important problem which has not yet been faced is the case of a current lea...

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Bibliographic Details
Published in:Microelectronics and reliability 2010-08, p.1700-1705
Main Authors: Infante, F., Perdu, Philippe, Lewis, Dean
Format: Article
Language:English
Subjects:
Electronics
Engineering Sciences
Online Access:Get full text
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Summary:The More than Moore axis of development in microelectronic technologies is generating increasingly complex assembly techniques. It has therefore become very hard to localize a current leakage inside such structures. One very important problem which has not yet been faced is the case of a current leakage on a ground plane, both at system and PCB level. This kind of problem cannot be solved with the techniques currently in use. Based on the recent developments of the magnetic microscopy techniques which involve the use of magnetic simulations to localize current leakages, we have developed a new methodology which allows us to localize currents flowing inside ground planes. To do that, we also developed a new way of generating magnetic simulations, which significantly increases the performance of localization in terms of analysis time and resolution.
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2010.07.109