RF impedance measurements of DC atmospheric micro-discharges

The available diagnostics for atmospheric micro-plasmas remain limited and relatively complex to implement; so we present a radio-frequency technique for diagnosing a key parameter here. The technique allows one to estimate the dependencies of the electron density by measuring the RF-impedance of th...

Full description

Saved in:
Bibliographic Details
Published in:The European physical journal. D, Atomic, molecular, and optical physics Atomic, molecular, and optical physics, 2010-12, Vol.60 (3), p.449-454
Main Authors: Overzet, L. J., Jung, D., Mandra, M. A., Goeckner, M., Dufour, T., Dussart, R., Lefaucheux, P.
Format: Article
Language:English
Subjects:
Applications of Nonlinear Dynamics and Chaos Theory
Atomic
Electric discharges
Exact sciences and technology
Glow
corona
Molecular
Optical and Plasma Physics
Physical Chemistry
Physics
Physics and Astronomy
Physics of gases, plasmas and electric discharges
Physics of plasmas and electric discharges
Plasma Physics
Quantum Information Technology
Quantum Physics
Spectroscopy/Spectrometry
Spintronics
Topical issue: Microplasmas: Scientific Challenges and Technological opportunities
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The available diagnostics for atmospheric micro-plasmas remain limited and relatively complex to implement; so we present a radio-frequency technique for diagnosing a key parameter here. The technique allows one to estimate the dependencies of the electron density by measuring the RF-impedance of the micro-plasma and analyzing it with an appropriate equivalent circuit. This technique is inexpensive, can be used in real time and gives reasonable results for argon and helium DC micro-plasmas in holes over a wide pressure range. The electron density increases linearly with current in the expected range consistent with normal glow discharge behavior.
ISSN:1434-6060
1434-6079
DOI:10.1140/epjd/e2010-00274-5