Precision increase with two orthogonal analyzers in polarization-resolved second-harmonic generation microscopy

We analyze the increase in precision of parameters estimation for polarization-resolved second-harmonic generation imaging microscopy when two intensities are measured with two orthogonal analyzers. The analysis is performed for measuring anisotropy parameters and molecule orientation for samples wi...

Full description

Saved in:
Bibliographic Details
Published in:Optics letters 2012-10, Vol.37 (20), p.4173-4175
Main Authors: Réfrégier, Philippe, Roche, Muriel, Duboisset, Julien, Brasselet, Sophie
Format: Article
Language:English
Subjects:
Engineering Sciences
Image Processing, Computer-Assisted - methods
Microscopy
Microscopy - methods
Noise
Optics
Orientation
Photonic
Photons
Poisson Distribution
Samples
Statistical analysis
Statistics
Symmetry
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We analyze the increase in precision of parameters estimation for polarization-resolved second-harmonic generation imaging microscopy when two intensities are measured with two orthogonal analyzers. The analysis is performed for measuring anisotropy parameters and molecule orientation for samples with cylindrical symmetry in the presence of photon noise with Poisson statistics. The improvement in comparison to global intensity measurement (i.e., without analyzer) is discussed.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.37.004173