Comments on the paper “Bragg’s law diffraction simulations for electron backscatter diffraction analysis” by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood

This comment on the paper "Bragg's Law diffraction simulations for electron backscatter diffraction analysis" by Kacher et al. explains the limitations in determining elastic strains using synthetic EBSD patterns. Of particular importance are those due to the accuracy of determination...

Full description

Saved in:
Bibliographic Details
Published in:Ultramicroscopy 2010-06, Vol.110 (7), p.758-759
Main Authors: Maurice, Claire, Fortunier, Roland, Driver, Julian, Day, Austin, Mingard, Ken, Meaden, Graham
Format: Article
Language:English
Subjects:
Calibration
EBSD
Engineering Sciences
Materials
Scanning electron microscope
Strain
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This comment on the paper "Bragg's Law diffraction simulations for electron backscatter diffraction analysis" by Kacher et al. explains the limitations in determining elastic strains using synthetic EBSD patterns. Of particular importance are those due to the accuracy of determination of the EBSD geometry projection parameters. Additional references and supporting information are provided.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2010.02.003