Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy

We present a simple method to quantitatively image the dielectric permittivity of soft materials at nanoscale using electrostatic force microscopy (EFM) by means of the double pass method. The EFM experiments are based on the measurement of the frequency shifts of the oscillating tip biased at two d...

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Bibliographic Details
Published in:Physical review. E, Statistical, nonlinear, and soft matter physics Statistical, nonlinear, and soft matter physics, 2010-01, Vol.81 (1 Pt 1), p.010801-010801, Article 010801
Main Authors: Riedel, C, Arinero, R, Tordjeman, Ph, Lévêque, G, Schwartz, G A, Alegria, A, Colmenero, J
Format: Article
Language:English
Subjects:
Engineering Sciences
Fluid mechanics
Fluids mechanics
Mechanics
Physics
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Summary:We present a simple method to quantitatively image the dielectric permittivity of soft materials at nanoscale using electrostatic force microscopy (EFM) by means of the double pass method. The EFM experiments are based on the measurement of the frequency shifts of the oscillating tip biased at two different voltages. A numerical treatment based on the equivalent charge method allows extracting the values of the dielectric permittivity at each image point. This method can be applied with no restrictions of film thickness and tip radius. This method has been applied to image the morphology and the nanodielectric properties of a model polymer blend of polystyrene and poly(vinyl acetate).
ISSN:1539-3755
1550-2376
DOI:10.1103/PhysRevE.81.010801