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Thermally excited tunneling from a metastable electronic state in a single-Cooper-pair transistor
Metastable electron traps and two-level systems (TLSs) are common in solid-state devices and lead to background charge movement and charge noise in single-electron and single-Cooper-pair transistors. We present measurements of the real-time capture and escape of individual electrons in metastable tr...
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Published in: | Applied physics letters 2008-10, Vol.93 (17) |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Metastable electron traps and two-level systems (TLSs) are common in solid-state devices and lead to background charge movement and charge noise in single-electron and single-Cooper-pair transistors. We present measurements of the real-time capture and escape of individual electrons in metastable trapped states at very low temperatures, leading to charge offsets close to 1e. The charge movement exhibits thermal excitation to a hysteretic tunneling transition. The temperature dependence and hysteresis can be explained by the coupling of a TLS to a quasiparticle trap. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.3012374 |