Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures

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Bibliographic Details
Published in:The European physical journal. ST, Special topics Special topics, 2012-06, Vol.208
Main Authors: Favre-Nicolin, V., Proietti, M. G., Leclere, Cédric, Katcho, N. A., Richard, M.I., Hubert, Renevier
Format: Article
Language:English
Subjects:
Chemical Sciences
Material chemistry
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ISSN:1951-6355
1951-6401
DOI:10.1140/epjst/e2012-01619-x