Quantitative analysis of shadow X-ray Magnetic Circular Dichroism Photo-Emission Electron Microscopy

Shadow X-ray Magnetic Circular Dichroism Photo-Emission Electron Microscopy (XMCD-PEEM) is a recent technique, in which the photon intensity in the shadow of an object lying on a surface, may be used to gather information about the three-dimensional magnetization texture inside the object. Our purpo...

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Bibliographic Details
Published in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2015-10, Vol.92 (14)
Main Authors: Jamet, Ségolène, da Col, Sandrine, Rougemaille, Nicolas, Wartelle, Alexis, Locatelli, Andrea, Mentes, T.O., Burgos, B. Santos, Afid, Raja, Cagnon, Laurent, Bochmann, Sebastian, Bachmann, Julien, Fruchart, Olivier, Toussaint, Jean-Christophe
Format: Article
Language:English
Subjects:
Condensed Matter
Other
Physics
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Summary:Shadow X-ray Magnetic Circular Dichroism Photo-Emission Electron Microscopy (XMCD-PEEM) is a recent technique, in which the photon intensity in the shadow of an object lying on a surface, may be used to gather information about the three-dimensional magnetization texture inside the object. Our purpose here is to lay the basis of a quantitative analysis of this technique. We first discuss the principle and implementation of a method to simulate the contrast expected from an arbitrary micromagnetic state. Text book examples and successful comparison with experiments are then given. Instrumental settings are finally discussed, having an impact on the contrast and spatial resolution : photon energy, microscope extraction voltage and plane of focus, microscope background level, electric-field related distortion of three-dimensional objects, Fresnel diffraction or photon scattering.
ISSN:1098-0121
1550-235X
DOI:10.1103/PhysRevB.92.144428