Editorial, Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015

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Bibliographic Details
Published in:Microelectronics and reliability 2015, Vol.55 (9-10)
Main Authors: Bafleur, Marise, Perdu, Philippe, Marc, François, Frémont, Hélène, Nolhier, Nicolas
Format: Article
Language:English
Subjects:
Engineering Sciences
Micro and nanotechnologies
Microelectronics
Online Access:Get full text
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Summary:
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2015.09.028