A comprehensive simulation model for immunity prediction in integrated circuits with respect to substrate injection

This paper presents a comprehensive modelling methodology for the electromagnetic immunity of integrated circuits (ICs) to direct power injection (DPI). The aim of this study is to predict the susceptibility of ICs by the means of simulations performed on an appropriate electrical model of different...

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Bibliographic Details
Published in:Microelectronics 2009-12, Vol.40 (12), p.1788-1795
Main Authors: Alaeldine, Ali, Perdriau, Richard, Haidar, Ali
Format: Article
Language:English
Subjects:
DPI
Electromagnetism
EMC
Engineering Sciences
Protection techniques
Substrate modelling
Susceptibility modelling
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Summary:This paper presents a comprehensive modelling methodology for the electromagnetic immunity of integrated circuits (ICs) to direct power injection (DPI). The aim of this study is to predict the susceptibility of ICs by the means of simulations performed on an appropriate electrical model of different integrated logic cores located in the same die. These cores are identical from a functional point of view, but differ by their design strategies. The simulation model includes the whole measurement setup as well as the integrated circuit under test, its environment (PCB, power supply) and the substrate model of each logic core. Simulation results and comparisons with measurement results demonstrate the validity of the suggested model. Moreover, they highlight the interest of the aforementioned protection strategies against electromagnetic disturbances.
ISSN:1879-2391
0026-2692
1879-2391
DOI:10.1016/j.mejo.2009.10.004